2017
DOI: 10.1088/1742-6596/929/1/012048
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Thin-film fractal nanostructures formed by electrical breakdown

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“…Atomic force microscopy AFM [40][41][42][43][44][45] and scanning electron microscopy SEM [42][43][44]46] are widely used to study surface topography and fractal analysis [45,46]. Researchers evaluated the hierarchical surface topography by means of determining the fractal dimension and power spectral density (PSD) of surface topography recorded by atomic force microscopy (AFM) [45].…”
Section: Introductionmentioning
confidence: 99%
“…Atomic force microscopy AFM [40][41][42][43][44][45] and scanning electron microscopy SEM [42][43][44]46] are widely used to study surface topography and fractal analysis [45,46]. Researchers evaluated the hierarchical surface topography by means of determining the fractal dimension and power spectral density (PSD) of surface topography recorded by atomic force microscopy (AFM) [45].…”
Section: Introductionmentioning
confidence: 99%