2019
DOI: 10.1116/1.5123286
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Thick film hydrogen silsesquioxane planarization for passive component technology associated with electronic-photonic integrated circuits

Abstract: Thick film hydrogen silsesquioxane planarization for passive component technology associated with electronic-photonic integrated circuits.

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Cited by 6 publications
(11 citation statements)
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References 13 publications
(13 reference statements)
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“…The electrode of the EAM is designed with a circular pad of 60 µm diameter integrated on a thick low-permittivity insulator. The HSQ planarization method explained in [10], is used to fabricate the insulating layer. This approach is for the first time applied here to reduce the bond-pad capacitance in this type of photonic integration.…”
Section: Design and Device Structurementioning
confidence: 99%
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“…The electrode of the EAM is designed with a circular pad of 60 µm diameter integrated on a thick low-permittivity insulator. The HSQ planarization method explained in [10], is used to fabricate the insulating layer. This approach is for the first time applied here to reduce the bond-pad capacitance in this type of photonic integration.…”
Section: Design and Device Structurementioning
confidence: 99%
“…The capacitance can be reduced by using a low-permittivitymaterial as the insulator for the bond pad which can also provide the necessary planarization. Conventional planarization methods such as those based on BCB (benzocyclobutene) or polyimide materials are difficult to apply or are incompatible with some photonic integration steps [10]. Another option, Hydrogen Silsesquioxane (HSQ) planarization is commonly used in standard integrated circuits for multilevel metal interconnects [11].…”
Section: Introductionmentioning
confidence: 99%
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“…An additional etch step is needed to deep etch the EAM section. The lowpermittivity film required for the connection to the EAM was built up using successive HSQ spin-on coatings [9], with 5 spin coatings required to obtain a 6 µm film thickness. After each spin coating, the sample was patterned using Electron Beam (EB), followed by deposition of 40 nm of SiO2 using Plasma-Enhanced Chemical Vapor Deposition (PECVD).…”
Section: Fabricationmentioning
confidence: 99%
“…In this work we report, for the first time, an EML integrated with TW EAM based on the identical epitaxial layer design and using a side-wall grating (SWG) for the DFB laser. A novel planarization method based on hydrogen silsesquioxane (HSQ) spin-on coating [4], was used to create a 2.4-µm-thick low-permittivity film (εr ≈ 3.8) on which the TW electrode was fabricated. The EML chip comprised a DFB, EAM, and semiconductor optical amplifier (SOA) of lengths 600 µm, 150 µm, and 320 µm, respectively.…”
mentioning
confidence: 99%