2007
DOI: 10.3103/s0003701x07040184
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Thermovoltaic properties of technical silicon melted by solar radiation

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Cited by 13 publications
(4 citation statements)
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“…TCE was theoretically predicted in [7] and experimentally discovered on heated p-n structures fabricated by various methods, including structures based on SCPS [8], then on samples produced by zone melting in a solar furnace of technical silicon [9], and then even on single-crystalline structures, but subjected to ion implantation of alkali metals or irradiation with fast electrons with E = 1 MeV [10], without subsequent annealing of radiation-induced defects. Studies have shown that the value of TCE depends on the concentration of defects in the material, which was explained in accordance with [5] by the generation of charge carriers due to the absorption of subband photons with the participation of deep energy levels caused by structural defects, as well as the presence in it of deep impurities such as Fe, Cu, Mn, Mg, Ti, etc.…”
Section: Rationale and Methodology Of Experimentsmentioning
confidence: 99%
“…TCE was theoretically predicted in [7] and experimentally discovered on heated p-n structures fabricated by various methods, including structures based on SCPS [8], then on samples produced by zone melting in a solar furnace of technical silicon [9], and then even on single-crystalline structures, but subjected to ion implantation of alkali metals or irradiation with fast electrons with E = 1 MeV [10], without subsequent annealing of radiation-induced defects. Studies have shown that the value of TCE depends on the concentration of defects in the material, which was explained in accordance with [5] by the generation of charge carriers due to the absorption of subband photons with the participation of deep energy levels caused by structural defects, as well as the presence in it of deep impurities such as Fe, Cu, Mn, Mg, Ti, etc.…”
Section: Rationale and Methodology Of Experimentsmentioning
confidence: 99%
“…В [13] было предсказано существование тепловольтаического эффекта, заключающегося в генерации носителей заряда в нагреваемом полупроводнике с поглощением субзонных фотонов, происходящим с участием приме-сей и (или) дефектов, дающих глубокие энергетические уровни и присутствующих в Si в больших, более чем 3×10 18 см −3 , концентрациях. Экспериментально этот эффект был обнаружен в 2007 г. на материалах, априори изобилующих дефектами и (или) примесями, дающими в кремнии глубокие энергетические уровни, а именно, на нагреваемых структурах из поликристаллического кремния [14], затем на переплавленном на солнечной печи техническом кремнии [15] и, наконец, на образцах монокристаллического кремния, облученных быстрыми электронами с энергией 1 МэВ или подвергнутых ионной имплантации щелочных металлов, но в обоих случаях, без отжига наведенных радиационных дефектов [16]. Проявление тепловольтаического эффекта сопровождается аномальным, ростом коэффициента Зеебека, измеряемого на таких Si образцах при нагреве.…”
Section: обоснование технического решения результаты и их обсуждениеunclassified
“…A similar effect for completely different materials has been observed in recent years by scientists from the Physical-Technical Institute of the Uzbekistan Academy of Sciences. In [8], it was reported about the occurrence of EMF and current during uniform heating of samples with simple ohmic contacts made of polycrystalline silicon, was obtained by multiple remelting of technical silicon in the open air in a solar furnace. A similar effect, i.e.…”
Section: Introductionmentioning
confidence: 99%