“…While the microstructure is often deliberately modified to tailor material properties [for example, inducing spin-reorientation transition (Weller et al, 2000), magneticnon-magnetic transition (Dev et al, 2006) and, vice versa, introducing impurities (Bera et al, 2007b), extending the energy range for reflectivity], it may become naturally modified/damaged during actual applications [e.g. heating (Nakajima et al, 1992;Kapta et al, 2004), X-ray beam impingement (Bera et al, 2003;Takacs et al, 1985)]. It is important to understand these structural changes in order to assess the stability of device functionality.…”