2016 17th International Conference on Electronic Packaging Technology (ICEPT) 2016
DOI: 10.1109/icept.2016.7583318
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Thermal fatigue reliability analysis of PBGA with Sn63Pb37 solder joints

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Cited by 7 publications
(1 citation statement)
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“…Both thermo-mechanical fatigue and thermal ageing pose a significant threat to the long-term reliability of solder interconnects. In order to understand how reliable these interconnects are, metallurgical changes that affect characteristics of solder interconnect, such as bond formation, creep and fatigue behaviour must be fully understood [15][16][17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…Both thermo-mechanical fatigue and thermal ageing pose a significant threat to the long-term reliability of solder interconnects. In order to understand how reliable these interconnects are, metallurgical changes that affect characteristics of solder interconnect, such as bond formation, creep and fatigue behaviour must be fully understood [15][16][17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%