2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS) 2019
DOI: 10.1109/comcas44984.2019.8958104
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Thermal-aware GaN/Si MMIC design for space applications

Abstract: Thermal stress in microwave power devices is a major issue for space applications, with a detrimental impact on the operating lifetime of MMICs on board satellites. To limit this, derating rules are applied to the maximum operating junction temperature, which however limit the potential device performance when GaN/Si technology is employed. In this framework, classical power amplifier design paradigm must be reconsidered, moving to a thermal-aware design approach. To this aim, it is crucial to have access to h… Show more

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Cited by 23 publications
(12 citation statements)
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“…Therefore, in the design of MMIC PAs with a strict junction temperature limit, it is necessary to start from the thermal dissipation load-pull of a transistor, take the junction temperature as an important additional constraint, and combine it with the selection of the optimal impedance region of the transistor and the synthesis of the matched impedance trajectory of MN. [16][17][18][19] In order to facilitate calculations, in this paper the equation for roughly estimating the junction temperature of the device described in References 16,17 is adopted as shown in Equations ( 13) and (14). The junction temperature constraint of a transistor can be transformed into the dissipation power (P diss ) constraint, as shown in Equation (15).…”
Section: Constraints For Junction Temperaturementioning
confidence: 99%
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“…Therefore, in the design of MMIC PAs with a strict junction temperature limit, it is necessary to start from the thermal dissipation load-pull of a transistor, take the junction temperature as an important additional constraint, and combine it with the selection of the optimal impedance region of the transistor and the synthesis of the matched impedance trajectory of MN. [16][17][18][19] In order to facilitate calculations, in this paper the equation for roughly estimating the junction temperature of the device described in References 16,17 is adopted as shown in Equations ( 13) and (14). The junction temperature constraint of a transistor can be transformed into the dissipation power (P diss ) constraint, as shown in Equation (15).…”
Section: Constraints For Junction Temperaturementioning
confidence: 99%
“…Once the topology of second harmonic matching has been obtained, its A matrix [A 2f0 ] as well as Г omn@2f0 can be calculated. Then the constraints (16) are applied under the condition of a = 1 and b = c = 0, to obtain the value of the components.…”
Section: Output Matching Network Designmentioning
confidence: 99%
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“…Considering the lower thermal conductivity of Si as compared to that of the standard silicon-carbide (SiC) typically adopted in GaN processes [26], a careful technology assessment and power budget analysis was initially carried out. In addition, an accurate thermal evaluation of the technology was performed by using Raman measurement [27].…”
Section: Mmic Designmentioning
confidence: 99%
“…7 together with the T j behavior of the device. The latter was evaluated relying upon the electrothermal model provided by the foundry, as discussed in [27].…”
Section: Design Stepsmentioning
confidence: 99%