1992
DOI: 10.1016/0038-1101(92)90231-z
|View full text |Cite
|
Sign up to set email alerts
|

Theory of the photovoltage at semiconductor surfaces and its application to diffusion length measurements

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

1
25
0
1

Year Published

1993
1993
2009
2009

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 25 publications
(27 citation statements)
references
References 11 publications
1
25
0
1
Order By: Relevance
“…Similar results have also been obtained by Jang using a somewhat different approach [87]. Finally, Choo has studied numerically both the free surface SPV [77] and the metal±semiconductor interface SPV [80], and concluded that typically the FQL approximation is considerably more satisfactory in the former than in the latter.…”
Section: Super-bandgap Spvsupporting
confidence: 72%
See 4 more Smart Citations
“…Similar results have also been obtained by Jang using a somewhat different approach [87]. Finally, Choo has studied numerically both the free surface SPV [77] and the metal±semiconductor interface SPV [80], and concluded that typically the FQL approximation is considerably more satisfactory in the former than in the latter.…”
Section: Super-bandgap Spvsupporting
confidence: 72%
“…Chiang and Wagner [73] assumed a similar equality, SPV F n À F p À Á xw . Unfortunately, the latter relation is erroneous for the case of a free surface [77]. As opposed to the case depicted in Fig.…”
Section: Super-bandgap Spvmentioning
confidence: 91%
See 3 more Smart Citations