1999
DOI: 10.1016/s0167-5729(99)00002-3
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Surface photovoltage phenomena: theory, experiment, and applications

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Cited by 1,518 publications
(847 citation statements)
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References 611 publications
(1,189 reference statements)
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“…• H and He not detectable 129 • Damage and decomposition of soft and metastable materials 131 • Preferential sputtering during depth-profiling can remove more volatile components and change composition 30 • Beam-induced changes in oxidation state 129 • Binding energy shift due to charge accumulation, as well as junction and surface photovoltage 129,132 • Gas-phase surface contaminants can occur 129 Auger electron spectroscopy (AES) Sample irradiated with 3-20 keV electrons, ejecting core-level electrons in atoms and creating vacancies. Relaxation of outer electron to vacancy results in emission of Auger electron.…”
Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning
confidence: 99%
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“…• H and He not detectable 129 • Damage and decomposition of soft and metastable materials 131 • Preferential sputtering during depth-profiling can remove more volatile components and change composition 30 • Beam-induced changes in oxidation state 129 • Binding energy shift due to charge accumulation, as well as junction and surface photovoltage 129,132 • Gas-phase surface contaminants can occur 129 Auger electron spectroscopy (AES) Sample irradiated with 3-20 keV electrons, ejecting core-level electrons in atoms and creating vacancies. Relaxation of outer electron to vacancy results in emission of Auger electron.…”
Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning
confidence: 99%
“…132,168,169 These effects are common in the semiconductors used in photovoltaic applications. In particular, the excitation energies used for XPS/UPS measurements may produce a sufficient amount of free charge carriers to result in a surface photovoltaic effect and change the surface band bending.…”
mentioning
confidence: 99%
“…31 SPS uses a semitransparent Kelvin probe that contactlessly probes the surface potential change of an illuminated film (Figure 1) versus the excitation energy. 32,33 Measurable signals can be due to motion of free charge carriers through the film or the interface, due to polarization of charge Figure 1. Geometry of SPV measurement and example spectra.…”
Section: ■ Introductionmentioning
confidence: 99%
“…In SPS, a semi-transparent Kelvin electrode measures the contact potential difference (CPD) of an illuminated photocatalyst film (Fig. 25) as a function of the excitation energy [187,188]. The measured photovoltage (ΔCPD) is produced by the transfer of free charge carriers or polarization of bound charge carrier pairs (polarons) in the sample [189][190][191].…”
Section: Measuring Photovoltage In Nanoscale Photocatalystsmentioning
confidence: 99%