1984
DOI: 10.1109/t-ed.1984.21603
|View full text |Cite
|
Sign up to set email alerts
|

The phase-shifting mask II: Imaging simulations and submicrometer resist exposures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
13
0
1

Year Published

1985
1985
2016
2016

Publication Types

Select...
5
5

Relationship

0
10

Authors

Journals

citations
Cited by 49 publications
(14 citation statements)
references
References 2 publications
0
13
0
1
Order By: Relevance
“…The original publication and many subsequent studies (e.g. [84]) focus on the application of this method for projection lithography, but already in this work the potential for resolution enhancement in proximity lithography was emphasized. In contrast to projection lithography, for which the phase-shifting method was explored in-depth [85], it was not realized for generalized geometries in proximity lithography for over 30 years.…”
Section: Early Attempts For Resolution Enhancementmentioning
confidence: 99%
“…The original publication and many subsequent studies (e.g. [84]) focus on the application of this method for projection lithography, but already in this work the potential for resolution enhancement in proximity lithography was emphasized. In contrast to projection lithography, for which the phase-shifting method was explored in-depth [85], it was not realized for generalized geometries in proximity lithography for over 30 years.…”
Section: Early Attempts For Resolution Enhancementmentioning
confidence: 99%
“…After phase-shifting masks were first introduced [12], modeling has proven to be indispensable in their study. Levenson used modeling extensively to understand the effects of phase masks [13]. One of the earliest studies of phaseshifting masks used modeling to calculate images for Levenson's original alternating phase mask, then showed how phase masks increased defect printability [14].…”
Section: A Research Toolmentioning
confidence: 99%
“…Levenson used modeling extensively to understand the effects of phase masks [20]. One of the earliest studies of phase-shifting masks used modeling to calculate images for Levenson's original alternating phase mask, then showed how phase masks increased defect printability [21].…”
Section: Research Toolmentioning
confidence: 99%