2011
DOI: 10.1016/j.jcrysgro.2010.11.095
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The effect of different oriented sapphire substrates on the growth of polar and non-polar ZnMgO by MOCVD

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Cited by 4 publications
(1 citation statement)
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“…The former is the near-band-edge (NBE) emission attributed to the recombination of excitons through an exciton-exciton collision process, and the latter is attributed to deep level defects, possibly be summed up to be zinc interstitials, oxygen vacancies, zinc vacancies, oxygen interstitials, or donor-acceptor transitions between defects complex. The intensity of NBE emission from the a-ZnO film is at least five times as that from the c-ZnO film, different from previous studies on in-plane polar ZnO films on sapphire; for instance, Shi et al [28] fabricated the cZnO, a-ZnO, and m-ZnO on c-Al 2 O 3 , r-Al 2 O 3 , and mAl 2 O 3 , respectively, and found weaker NBE emissions from the a-ZnO and m-ZnO than that from the c-ZnO. On the other hand, for well-prepared GaN, the nonpolar oriented films and quantum wells usually benefit to enhanced PL intensities [29].…”
contrasting
confidence: 97%
“…The former is the near-band-edge (NBE) emission attributed to the recombination of excitons through an exciton-exciton collision process, and the latter is attributed to deep level defects, possibly be summed up to be zinc interstitials, oxygen vacancies, zinc vacancies, oxygen interstitials, or donor-acceptor transitions between defects complex. The intensity of NBE emission from the a-ZnO film is at least five times as that from the c-ZnO film, different from previous studies on in-plane polar ZnO films on sapphire; for instance, Shi et al [28] fabricated the cZnO, a-ZnO, and m-ZnO on c-Al 2 O 3 , r-Al 2 O 3 , and mAl 2 O 3 , respectively, and found weaker NBE emissions from the a-ZnO and m-ZnO than that from the c-ZnO. On the other hand, for well-prepared GaN, the nonpolar oriented films and quantum wells usually benefit to enhanced PL intensities [29].…”
contrasting
confidence: 97%