Texture analysis with high-energy synchrotron radiation

Wcislak, L.; Klein, Helmut; Bunge, H. J.; Garbe, Ulf; Tschentscher, Th.; Schneider, J. R.

doi:10.1107/s0021889801019902

Cited by 66 publications

(53 citation statements)

References 16 publications

(18 reference statements)

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“…Anyway, in this case of single crystal structure analysis, the application of other techniques, for example the use of an area instead of a single detector, is much more promising for the future (e.g. Bunge and Klein 1996;Wcislak et al 2002).…”

Section: Texture Analyses-methodical Aspectsmentioning

confidence: 99%

Structural characteristics of the halite fabric type ‘Kristallbrocken’ from the Zechstein Basin with regard to its development

Küster

Leiss²,

Schramm

2008

Int J Earth Sci (Geol Rundsch)

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Section: Texture Analyses-methodical Aspectsmentioning

confidence: 99%

Structural characteristics of the halite fabric type ‘Kristallbrocken’ from the Zechstein Basin with regard to its development

Küster

Leiss²,

Schramm

2008

Int J Earth Sci (Geol Rundsch)

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“…The method is described in detail elsewhere (Wcislak et al,2002;especially Raue and Klein,2011). Hence only the basics are described here for a better intelligibility.…”

Section: X-ray Analysis and Mathematical Texture Calculationsmentioning

confidence: 99%

New insights in prism orientation within human enamel

Raue

Gersdorff

Rödiger

et al. 2012

Archives of Oral Biology

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The knowledge about the orientation of the prisms in human dental enamel is mainly based on morphological observations (light optical, SEM etc.). Hence there are many schematic drawings, showing the orientation as seen in the microscope. Locally resolved direct measurements of the orientations, proofing the observations, have not been done in detail up to now. X-ray diffraction methods adapted from material science are used in this study, providing directly the orientation of the crystallites in the examined positions. Hereby new and better detailed information was obtained, showing the orientation of the prisms and giving information about their intrinsic structure. Based on the measurements, existing prism orientation models can be enhanced and two structural suggestions can be made, showing possible inner building principles for the prisms. Future planned measurements will even allow deciding which of the two models is more likely.

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“…The high photon flux of synchrotron radiation allows for efficient diffraction measurements of materials whose low crystal symmetry, small scattering cross section, or high beam sensitivity limits the characterization that is possible with an in house, labbased source due to low signal to noise ratios 25 . Even for samples for which the aforementioned limitations do not apply, the use of high flux synchrotron radiation greatly reduces collection time required, and together with the use of an area detector allows for rapid pole figure collection (minutes rather than hours) 26,27 .…”

Section: Introductionmentioning

confidence: 99%

Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

Baker¹,

et al. 2010

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As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological and crystallographic information is needed to predict and optimize the film's electronic, optical and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector in two simple sample geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomlypacked metallic nanoparticle films. This method can be immediately implemented to help 2 understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.Keywords: grazing-incidence X-ray diffraction; pole figure; texture analysis; morphology; thin film IntroductionThe optical and electronic properties of polycrystalline and semicrystalline materials are highly dependent on the materials' morphology. When these properties are anisotropic in the single crystal form, the corresponding bulk properties of the poly-or semi-crystalline material are often dependent upon the orientation distribution of the crystallites.1 As efforts are made to optimize the electrical and optical properties of functional, solution-processed polycrystalline films used for thin film transistors, solar cells, and other emerging technologies, it is necessary to fully characterize the orientation distribution, or texture, of the crystallites. There has been much effort devoted to correlating the microstructure and properties of thin films (<100 nm) of nanostructured organic semiconductors 2-7 and inorganic semiconducting nanoparticles 8,9 , but the collection of complete texture information is often challenging due to the limited film thickness.In this work, we introduce an X-ray diffraction-based method for collecting and constructing quantitative pole figures with an area detector for thin films with isotropic crystallographic orientation in the substrate plane (classically referred to as fiber texture). The technique is rapid and ideal for thin films that are sensitive to beam damage, diffract weakly or are otherwise limited by their thin film form to certain diffraction geometries. 3A pole figure is a plot of the orientation distribution of a particular set of crystallographic lattice planes, providing a useful illustration of a material's texture. Traditional pole figures of bulk samples can be collected in either reflection or transmission mode. Pole figures collected in a reflection mode utilize a symmetric geometry introduced by Schultz 10-12 . In this technique, diffraction intensities are collected using a point detector as the sample is rotated along two axes.Accurate collection of intensity in the Schultz geometry is generally limited to within 85° of the surface normal, due to distortions t...

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Texture analysis with high-energy synchrotron radiation

Cited by 66 publications

References 16 publications

Structural characteristics of the halite fabric type ‘Kristallbrocken’ from the Zechstein Basin with regard to its development

Structural characteristics of the halite fabric type ‘Kristallbrocken’ from the Zechstein Basin with regard to its development

New insights in prism orientation within human enamel

Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

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