Testing and Reliability

Scaling potential of pin-type 3-D SBT ferroelectric capacitors integrated in 0.18μm CMOS technology

“…Fig. 8 suggests that the plots of Pop * and Pop^are linearly dependent on log time, in agreement with the literature [12]. Bearing in mind that Pop * and Pop^correspond to the minimum switching polarization and to the maximum non-switching polarization, respectively, due to the imprint effect, the difference Pop * À Pop^yields the smallest possible sensing window.…”