Testability-analysis driven test-generation of analogue cores

The test search for true mixed-signal cores

“…In a previous paper [4], a new expression for the TTF for analogue transistor-level circuits has been derived, overcoming previous [2,3] fundamental problems, like low sensitivity for low impedances and connections to power lines.…”

“…Based on this definition, also the TTF of a transistor can be derived, and hence of complete transistor networks [4].…”

“…The details of these matrix calculations can be found in [4,5]. It is stressed that the concept of TTFs are not limited to voltages or currents only, but can also include crossrelations between them.…”

“…In references [2][3][4][5], the concept of the testability transfer function (TTF) for analogue [2][3][4] as well as digital [5] cores has been introduced and enhanced. This paper combines the TTFs of both worlds, thereby opening the road to relative low-cost mixed-signal testability-based ATPG, and increased debugging capability.…”

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis

“…This approach has been adopted in [6] where the Signal Flow Graph method is introduced and the circuit is represented by a graph of interconnected impedances. Later, the concept of Testability Analysis has been introduced and has pushed further the analysis by deriving new values from the impedances [7] [8]. But as already stated, the nonlinearity these techniques can handle is limited.…”