2012
DOI: 10.1016/j.jallcom.2011.09.101
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Temperature dependent negative capacitance behavior of Al/rhodamine-101/n-GaAs Schottky barrier diodes and Rs effects on the C–V and G/ω–V characteristics

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Cited by 58 publications
(46 citation statements)
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“…This can be ascribed to the loss of interface states charges at the interface because of the impact ionization process. Similar results on negative capacitance phenomenon have been reported for the Al/rhodamine-101/n-GaAs Schottky barrier diodes by Vural et al [20]. Thus, the interface states charges have mainly importance on the capacitive property of the diode.…”
Section: Resultssupporting
confidence: 86%
“…This can be ascribed to the loss of interface states charges at the interface because of the impact ionization process. Similar results on negative capacitance phenomenon have been reported for the Al/rhodamine-101/n-GaAs Schottky barrier diodes by Vural et al [20]. Thus, the interface states charges have mainly importance on the capacitive property of the diode.…”
Section: Resultssupporting
confidence: 86%
“…In general, polarization mechanisms at low frequencies are affected by electronic, ionic, dipolar and interface or surface polarization distribution [24,25]. The high values of ε and ε investigated at low frequencies may be attributed to interfacial Maxwell-Wagner polarization [26] and space charge polarization [27].…”
Section: Frequency Dependence Of Dielectric Propertiesmentioning
confidence: 95%
“…There are many studies on the complex electric modulus M * formalism with regard to the analysis of dielectric or insulator materials [27,28]. The complex impedance Z * or the complex permittivity ε * = 1/M * data are transformed into the M * formalism using the following relation [11,[26][27][28].…”
Section: Frequency Dependence Of Dielectric Propertiesmentioning
confidence: 99%
See 1 more Smart Citation
“…The electronic parameters of MIS contacts depend on the properties of insulator layer, the interface properties between metal and semiconductor, series resistance and inhomogeneities of Schottky barrier heights [1][2][3][4]. Particularly, gallium-arsenide-based structures have been used as the basic component for high speed electronic, optoelectronic, and lasers because of their technical importance [5][6][7].…”
Section: Introductionmentioning
confidence: 99%