Cu 2 O/ZnO has been envisaged as a potential material system for the next-generation thin film solar cells. Thus far, the experimental efforts to obtain conversion efficiencies close to the theoretically predicted value have failed. Combining aberration-corrected (scanning) transmission electron microscopy and density functional theory modeling, we studied the interfaces between single-crystal caxis-oriented ZnO and high-quality magnetron-sputtered Cu 2 O films. Strikingly, our study shows that the first ∼5 nm of the Cu−oxide films has the structure of the monoclinic CuO phase. The CuO layer is textured with the (111), (111̅ ), (1̅ 11), (11̅ 1̅ ) (1̅ 1̅ 1), (11̅ 1), (1̅ 11̅ ,) and (100) planes parallel to the (0001) and (0001̅ ) ZnO interfaces. The ionic arrangement on these planes resembles the hexagonal arrangement of the ZnO interface, and epitaxy exists across the interface. A continued epitaxial growth of [111]-oriented Cu 2 O follows resulting in epitaxial 180°rotation twins in the Cu 2 O layer. For the case with the (100) CuO interfacial plane we have (111)[11̅ 0] Cu2O ∥(100)[011] CuO ∥(0001)[112̅ 0] ZnO . Because of a closer lattice matching of CuO with ZnO and Cu 2 O, the total strain and energy is reduced compared to a pure (111) Cu2O ∥(0001) ZnO interface. The existence of CuO is anticipated to be a contributing factor for the low conversion efficiencies obtained experimentally.