2002
DOI: 10.1016/s0927-0248(02)00119-8
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Temperature dependence of absorption coefficient spectra for μc-Si films by resonant photothermal bending spectroscopy

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Cited by 7 publications
(8 citation statements)
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“…[1]. The grain size was estimated by X-ray diffraction (XRD) [5][6][7]. The thickness of lcSi:H film was about 0.6 lm.…”
Section: Methodsmentioning
confidence: 99%
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“…[1]. The grain size was estimated by X-ray diffraction (XRD) [5][6][7]. The thickness of lcSi:H film was about 0.6 lm.…”
Section: Methodsmentioning
confidence: 99%
“…Fig. 1 shows a schematic illustration of the resonant-PBS system [2,[5][6][7]. An edge of the sample was fixed to a holder in a specially designed optical cryostat.…”
Section: Methodsmentioning
confidence: 99%
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“…Recently, there are some experimental studies about the absorption coefficient and the absorptivity [11,12]. However, few literatures investigate the characters of the absorption coefficient and the absorptivity theoretically in detail in pulsed laser ablation [10,13,14].…”
Section: Introductionmentioning
confidence: 99%