Temperature Compensation Method for Mechanical Base of 3D-Structured Light Scanners

Abstract

The effect of temperature on three-dimensional (3D) structured light scanners is a very complex issue that, under some conditions, can lead to significant deterioration of performed measurements. In this paper, we present the results of several studies concerning the effect of temperature on the mechanical base of 3D-structured light scanners. We also propose a software compensation method suitable for implementation in any existing scanner. The most significant advantage of the described method is the fact that it does not require any specialized artifact or any additional equipment, nor access to the thermal chamber. It uses a simulation of mechanical base thermal deformations and a virtual 3D measurement environment that allows for conducting virtual measurements. The results from the verification experiments show that the developed method can extend the range of temperatures in which 3D-structured light scanners can perform valid measurements by more than six-fold.

Temperature Compensation Method for Raster Projectors Used in 3D Structured Light Scanners

“…It can significantly decrease the thermal drift and deformation of the projected image. This paper is also the continuation of the studies described in [15,24,25], where the effects of temperature on the digital cameras, mechanical base, and the whole 3D SL scanner were introduced.…”

“…The effects of temperature on another two 3D SL scanner units—the mechanical base and the raster projector—also need to be investigated. The compensation method of the effect of temperature on the scanner base was the scope of my previous study, described in [ 25 ]. At the same time, no papers have described the impact of temperature on the thermal image drift and the deformation of images displayed by the raster projector.…”

A method for high dynamic range 3D color modeling of objects through a color camera

“…Three-dimensional measurement methods based on structured light are widely used in reverse engineering, heritage reconstruction, industrial inspection, and other fields based on their advantages in terms of high accuracy, non-contact measurement, and high efficiency [1][2][3]. A typical structuredlight measurement system consists of a structured-light projector and one or more cameras.…”

An Approach to an Intelligent Scanning of the Machine Tool Workspace

“…Structured light scanners are characterized by a high resolution and high accuracy of a few to several micrometers [11][12][13]. Even higher accuracy is difficult to obtain due to varying environmental factors (mainly ambient temperature), or the manufacturing accuracy of the calibration pattern [14,15]. Currently, scanners are only regulated by the VDI/VDE 2634 standard relating to three-dimensional optical measuring systems, whose main function is based on triangulation [16].…”