Abstract:Soft errors caused by particle strikes are expected to increase as technology scales down. This is partially because more single-event transients (SET) are latched by memory elements at the primary output of combinational circuits. To speed up the assessment of SET-induced soft errors, we propose a systematic analysis method to examine the probability of a SET eventually being latched. In previous work, the latching probability of SET is only modeled as a function of SET pulse width and clock period. As soft e… Show more
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