System on module total ionizing dose distribution modeling

Akhmetov, A. O.; Boychenko, Dmitry V.; Bobrovskiy, D. V.; Chumakov, A. I.; Kalashnikov, O. A.; Nikiforov, Alexander Y.; Nekrasov, Pavel V.

doi:10.1109/miel.2014.6842156

Cited by 22 publications

(5 citation statements)

References 6 publications

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“…Measurements were performed using a special PCB test-fixture and specialized microwave test system (MwTS), based on Cascade Summit 12000B microwave probe station, Agilent N5230A vector network analyzer, N9020A signal analyzer [10,11], shown in Fig.7. MwTS is successfully used with complex radiation test facilities for experimental studies and theoretical analysis of radiation effects in wide range complex multifunctional Very-Large-Scale mixed and digital ICs [12][13][14].…”

Section: Simulation and Experimental Resultsmentioning

confidence: 99%

System design considerations of universal UHF RFID reader transceiver ICS

et al. 2015

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This paper describes the architecture, system analysis and implementation of world-wide regulation compliant UHF RFID reader transceiver for ISO 18000-6 multi-class tags in the ISM band 860 MHz-960 MHz. The presented considerations are based on a system analysis providing evaluation of the transceiver's building blocks parameters in accordance with the required characteristics of a complete RFID reader system, read range, data transmission rate, reading speed and power consumption. The Phase Noise, Noise Figure, Sensitivity, P1dB, Dynamic Range are estimated for the design of a custom 'system-in-package' transceiver, implemented in LTCC-module. Based on the direct-conversion architecture, the reader transceiver integrates RFblocks, frequency synthesizer, modulation and demodulation functions, low frequency analog baseband. The receiver sensitivity is down to -85 dBm, the transmitter produces output power of +17 dBm.

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Section: Simulation and Experimental Resultsmentioning

confidence: 99%

System design considerations of universal UHF RFID reader transceiver ICS

et al. 2015

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“…For example, the total dose graphs presented in Fig. 7 demonstrate the extreme increase of RAM supply current at static irradiation mode, while the samples irradiated at dynamic mode are much harder [13].…”

Section: Fig 5 Functional Vs Parametric Tid Failures Quantities For Various Ics Classesmentioning

confidence: 99%

Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices

et al. 2015

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Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional ?simple? ICs. The main difficulty is to organize informative and quick functional tests directly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.

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“…Seven MCU samples were tested in different applications and environment conditions by using this complex [13][14][15]. Some test results obtained by using the hardware-software complex are presented below.…”

Section: Application and Developmentmentioning

confidence: 99%