The platform will undergo maintenance on Sep 14 at about 7:45 AM EST and will be unavailable for approximately 2 hours.
2015
DOI: 10.1364/ao.54.006334
|View full text |Cite
|
Sign up to set email alerts
|

Synthetic-wavelength interferometry improved with frequency calibration and unambiguity range extension

Abstract: We improve the accuracy of distance measurements with synthetic-wavelength interferometry by referencing the spectral spacing of the free-running light sources to a high-precision radio-frequency oscillator. In addition, we increase the unambiguity range with a time-of-flight technique. Distances to scattering technical surfaces can be measured with micrometer accuracy and an unambiguity range of 1.17 m. The measurement rate amounts to 300 Hz.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(4 citation statements)
references
References 26 publications
0
4
0
Order By: Relevance
“…This range could be extended by, e. g., subsequent measurements with different comb line spacings mod,sig f [1,12], by a combination with longerrange time-of-flight measurement schemes [21], or by using special schemes in which the LO comb also propagates to the measurement target [41].…”
Section: Measurement Principle and Data Processingmentioning
confidence: 99%
See 1 more Smart Citation
“…This range could be extended by, e. g., subsequent measurements with different comb line spacings mod,sig f [1,12], by a combination with longerrange time-of-flight measurement schemes [21], or by using special schemes in which the LO comb also propagates to the measurement target [41].…”
Section: Measurement Principle and Data Processingmentioning
confidence: 99%
“…Important requirements are high measurement precision, fast acquisition, and the ability to cope with natural technical surfaces characterized by roughness and strongly varying backscattered power levels. In the context of fast and precise distance metrology, optical frequency combs have emerged as valuable tools, either as light sources for the distance measurement itself [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18], or as a means for calibrating lasers, e.g., for synthetic-wavelength interferometry (SWI) [19][20][21] or for frequency-modulated continuous wave (FMCW) laser ranging [22,23]. However, all these demonstrations rely on rather complex and sensitive setups that cannot cope with the stringent requirements that are associated with industrial applications.…”
Section: Introductionmentioning
confidence: 99%
“…Using digital signal processing, phase differences ∆φ between neighboring lines of FC1 are extracted from the individual RF beat tones in the photocurrent, Fig. 1(d), and the distance is evalu-ated by a linear fit according to the relation L =∆φ•c/(4π•FSRFC1), see [2] for details. We use the fit error to quantify the quality of a distance measurement, which allows for automatic removal of bad data points.…”
Section: Dual-comb Distance Measurement Setup and High-precision Meas...mentioning
confidence: 99%
“…Fast and precise optical distance measurement (ODM) techniques are key for many industrial and scientific applications [1]. Among the various techniques, concepts based on frequency combs (FC) and synthetic wavelength interferometry (SWI) are particularly attractive: The precisely defined spacing of comb lines leads to high measurement accuracy independently of the absolute optical wavelength, and the large dynamic range of multi-heterodyne detection ensures robustness with respect to varying sample reflectivity [2][3][4]. The performance of such systems strongly depends on the underlying frequency comb.…”
Section: Introductionmentioning
confidence: 99%