2013
DOI: 10.1016/j.apsusc.2012.10.113
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Synthesis, phase to phase deposition and characterization of rutile nanocrystalline titanium dioxide (TiO2) thin films

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Cited by 37 publications
(14 citation statements)
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“…The incident beam optics consists of a Cu Kα radiation source (λ=1.5406Å). The crystallite size of 100 nm HfO 2 thin film has been calculated using well known Scherrer's Eq.2.1 [19][20].…”
Section: Methodsmentioning
confidence: 99%
“…The incident beam optics consists of a Cu Kα radiation source (λ=1.5406Å). The crystallite size of 100 nm HfO 2 thin film has been calculated using well known Scherrer's Eq.2.1 [19][20].…”
Section: Methodsmentioning
confidence: 99%
“…These results indicate that the concentrations of TiCl 3 solutions affected the degree of crystallinity, and TiO 2 with pure rutile phase can be synthesized by adjusting the concentrations of TiCl 3 solutions to 4 mM. In addition, an annealing treatment 550°C is required to convert the anatase phase into rutile phase [38]. Therefore, no anatase diffraction peak was observed in all samples, which reveals that the surface coating was in rutile phase.…”
Section: Morphological and Structural Characterization Of Tio 2 Nanorodsmentioning
confidence: 76%
“…01-078-1508. The average crystalline size of rutile TiO 2 NRs has been calculated using the well-known Scherrer's equation [29][30][31]. The crystalline size was determined to be 10.4 nm for the sample prepared at a concentration of 4 mM, which clearly reveals improvement in crystallinity [32].…”
Section: Morphological and Structural Characterization Of Tio 2 Nanorodsmentioning
confidence: 99%
“…Rutile belongs to the P24/mnm space group (D 4h symmetry) [57] and its Raman active modes occur at ca. 143 cm −1 (B 1g ), 447 cm −1 (E g ), 612 cm −1 (A 1g ) and 826 cm −1 [58][59][60][61][62]. Also a peak at ca.…”
Section: Resultsmentioning
confidence: 96%