2020
DOI: 10.3390/nano10081557
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Synthesis and Studies of Electro-Deposited Yttrium Arsenic Selenide Nanofilms for Opto-Electronic Applications

Abstract: Nanocomposite films grown by incorporating varying concentrations of Yttrium, a d-block rare-earth ion, into the binary chalcogenide Arsenic selenide host matrix is here presented. Films were grown via the wet-chemical electro-deposition technique and characterized for structural, optical, surface morphology, and photoluminescence (PL) properties. The X-ray Diffraction (XRD) result of the host matrix (pristine film) showed films of monoclinic structure with an average grain size of 36.2 nm. The composite films… Show more

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Cited by 8 publications
(5 citation statements)
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“…The direct bandgap energy of the as-prepared Cu NPs could be determined using the Tauc equation as follows: where; α acts as the absorption coefficient, hυ represents the photon energy. n is the assumed value of n = ½ for direct allowed transition and n = 2 for indirect allowed transition, C is the independent energy factor, and E g is the bandgap energy [ 47 , 48 ].…”
Section: Methodsmentioning
confidence: 99%
“…The direct bandgap energy of the as-prepared Cu NPs could be determined using the Tauc equation as follows: where; α acts as the absorption coefficient, hυ represents the photon energy. n is the assumed value of n = ½ for direct allowed transition and n = 2 for indirect allowed transition, C is the independent energy factor, and E g is the bandgap energy [ 47 , 48 ].…”
Section: Methodsmentioning
confidence: 99%
“…The improvement in the crystallinity could be of the films as SILAR cycles increased. The crystallite size (D) was calculated using Debye -Scherrer's formula in equation (1) as given by [17, 18} while the dislocation density ( ), lattice strain ( ) and inter-planar spacing (d) were evaluated using equation ( 2), ( 3) and (4) as given by [19,20]. (1)…”
Section: Methodsmentioning
confidence: 99%
“…The bulk density ( ) of CoSe material is 7.65 g/cm 3 while the change in mass (Δ ) of the substrates was obtained by measuring the mass of the substrates before and after deposition. Values of thickness (t) of the deposited thin films were evaluated using equation ( 5) as given by [20,24,25].…”
Section: Thickness Measurementmentioning
confidence: 99%
“…Micro-strain (𝜀) of thin film sample can be estimated using the expression in Eq. ( 4) as given by [29,30];…”
Section: Structural Analysismentioning
confidence: 99%