2012
DOI: 10.1016/j.jallcom.2011.08.035
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Synthesis and phosphorescence properties of Mn4+, La3+ and Ho3+ in MgAl2Si2O8

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Cited by 16 publications
(14 citation statements)
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“…phosphor at 722 nm, we took into account the emission spectrum of the undoped MgAl 2 Si 2 O 8 sample under the same excitation conditions. We reported the spectrum of the undoped MgAl 2 Si 2 O 8 in our previous article [17]. It showed an emission ranging from 600 to 800 nm with the three maximum at 617, 710, and 720 nm.…”
Section: Resultsmentioning
confidence: 92%
“…phosphor at 722 nm, we took into account the emission spectrum of the undoped MgAl 2 Si 2 O 8 sample under the same excitation conditions. We reported the spectrum of the undoped MgAl 2 Si 2 O 8 in our previous article [17]. It showed an emission ranging from 600 to 800 nm with the three maximum at 617, 710, and 720 nm.…”
Section: Resultsmentioning
confidence: 92%
“…were prepared in accordance with the published procedure. [10][11][12][13] All the prepared materials were characterized by XRD analysis, FT-IR, TG/DTA, SEM, EDX and nitrogen adsorption-desorption (BET) analysis. Moreover, the materials were used as catalysts in the reduction of nitroanilines.…”
Section: Resultsmentioning
confidence: 99%
“…Lastly, the materials were sintered at 1300 • Cfor3h. [10][11][12][13] After these steps, the substances were obtained and all the compounds were examined with XRD analysis using a Bruker AXS D8 Advance diffractometer which was run at 20-60 kV and 6-80 mA, 2θ = 10-90 • and a step of 0.002 • usingCuK α X-ray. The SEM images and EDX analysis were performed on a LEO 440 model scanning electron microscope using an accelerating voltage of 20 kV.…”
Section: Preparation and Characterization Of Materialsmentioning
confidence: 99%
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