2012
DOI: 10.1016/j.jssc.2012.05.004
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Synthesis and characterization of Bi-doped Mg2Si thermoelectric materials

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Cited by 65 publications
(29 citation statements)
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“…It has been shown that MgO can cause additional grain boundary scattering and hence reduce carrier mobility and electrical conductivity. 28,34 . The main parameters used in or extracted from the model are summarized in Table 3.…”
Section: Electronic Transport Analysismentioning
confidence: 99%
“…It has been shown that MgO can cause additional grain boundary scattering and hence reduce carrier mobility and electrical conductivity. 28,34 . The main parameters used in or extracted from the model are summarized in Table 3.…”
Section: Electronic Transport Analysismentioning
confidence: 99%
“…It has been reported that the combination of a nanocomposite structure along with the doping by a heavy atom, such as Bi, can provide a large number of carriers to optimize the TE properties of Mg 2 Si . To understand the effect of SiNW on the transport properties of heavily doped Mg 2 Si, we prepared samples with additions of Bi.…”
Section: Resultsmentioning
confidence: 94%
“…It must be noted that Mg 2 Si, Mg, and MgO are not detected from XRD analysis even if the Mg and O are possibly incorporated in the films because the Mg disk is used as a target and oxygen is incorporated in the Al 2 O 3 substrates. 9 This is considered to be due to the small Mg content in the film (below 0.5 at.%) and the introduction of H 2 gas under the film deposition that produce a small oxygen partial pressure as well as the small diffusion of oxygen from the substrates due to the low deposition temperature.…”
Section: Resultsmentioning
confidence: 99%