2010
DOI: 10.1002/pssc.200983244
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Switching characteristics of ZnO based transparent resistive random access memory devices grown by pulsed laser deposition

Abstract: Resistance switching characteristics, observed in metal oxide thin films, has recently attracted a great deal of attention to develop next generation low power, low cost, high speed, rugged and nonvolatile resistive random access memory (RRAM) devices. The memory effect in these materials is realized through the switching of the resistance of their thin films between two states of high and low resistances. Amongst the known metal oxides currently being explored for the development of RRAM, ZnO has been demonst… Show more

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Cited by 27 publications
(16 citation statements)
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“…Obtaining favorable endurance properties is one of the major challenges for ZnO-based T-RRAM [7][8][9][10]. It has been suggested that the memory window should achieve the requirement of at least one order of magnitude to allow for small and highly efficient sense amplifiers [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…Obtaining favorable endurance properties is one of the major challenges for ZnO-based T-RRAM [7][8][9][10]. It has been suggested that the memory window should achieve the requirement of at least one order of magnitude to allow for small and highly efficient sense amplifiers [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…Compared with the reported data, 1,[15][16][17][18][19] in addition to the small set/reset voltages, the proposed transparent ITO/ ACG/ITO memories also possess relative good performance in ON/OFF ratio and retention time. 1,[15][16][17][18][19] A highly transparent ITO/ACG/ITO RRAM has been presented.…”
mentioning
confidence: 82%
“…1,[15][16][17][18][19] A highly transparent ITO/ACG/ITO RRAM has been presented. The Al-chelated gelatin biomaterial memory with a transmittance of 83% at 550 nm, an ON/OFF current ratio of more than 10 5 , bipolar resistive switching, and the set voltage of around À0.5 V can be achieved.…”
mentioning
confidence: 99%
“…A typical RRAM device with metal-insulator-metal (MIM) structure undergoes the phenomenon of resistance change when activated by electrical signal and memory effect is realized through switching of the resistance of the device between the two states (high and low) of resistances (1)(2)(3). Depending on the polarity of the applied bias voltages, the resistance switching characteristic can be classified into two types unipolar or bipolar (4).…”
Section: Introductionmentioning
confidence: 99%