“…The rapid development of X-ray free-electron laser (XFEL) facilities like FLASH, FERMI, LCLS, SACLA, PAL-XFEL and SwissFEL (Ackermann et al, 2007;Allaria et al, 2010;Emma et al, 2010;Ishikawa et al, 2012;Oberta et al, 2011;Milne et al, 2017;Ko et al, 2017) has brought a wave of new experiments that use the high intensities, short pulses or high coherence properties of the FEL X-ray pulses. However, both machine operators and users quickly noted that the pulse properties could and would change on a shot-to-shot basis, especially for those facilities that produced their FEL light using the self-amplified spontaneous emissions (SASE) process (Saldin & Kondratenko, 1980;Bonifacio et al, 1984), making the evaluation of the data gathered during an experiment more difficult.…”