2000
DOI: 10.1063/1.126152
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Surface polarity dependence of Mg doping in GaN grown by molecular-beam epitaxy

Abstract: The effect of surface polarity on the growth of Mg-doped GaN thin films on c-plane sapphire substrates by molecular-beam epitaxy has been investigated. The doping behavior of Mg and resulting conductivity of the doped layers were found to strongly depend on the surface polarity of the growing GaN planes. The samples grown on the Ga-polar face (A face) exhibited a p-type conductivity with a free-hole concentration up to 5×1017 cm−3, while the samples grown on the N-polar face (B face) were highly resistive or s… Show more

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Cited by 105 publications
(71 citation statements)
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“…20 Thus, these results demonstrate that under identical growth conditions, net Mg acceptor incorporation is more efficient for Ga-face compared to N-face material. This observation is consistent with prior reports that Mg doping of GaN results in greater total Mg incorporation 8 and higher p-type conductivity 21 for material grown with Ga-face polarity compared to N-face material and suggests that avoidance of inversion domain formation is essential for optimization of p-type conductivity in GaN. In addition to revealing higher net Mg acceptor incorporation into Ga-face compared to N-face material, SCM imaging indicates that higher net concentrations of ionized Mg acceptors can occasionally be present in the immediate vicinity of inversion domain boundaries than in the surrounding Ga-face and N-face materials.…”
Section: ͑3͒supporting
confidence: 82%
“…20 Thus, these results demonstrate that under identical growth conditions, net Mg acceptor incorporation is more efficient for Ga-face compared to N-face material. This observation is consistent with prior reports that Mg doping of GaN results in greater total Mg incorporation 8 and higher p-type conductivity 21 for material grown with Ga-face polarity compared to N-face material and suggests that avoidance of inversion domain formation is essential for optimization of p-type conductivity in GaN. In addition to revealing higher net Mg acceptor incorporation into Ga-face compared to N-face material, SCM imaging indicates that higher net concentrations of ionized Mg acceptors can occasionally be present in the immediate vicinity of inversion domain boundaries than in the surrounding Ga-face and N-face materials.…”
Section: ͑3͒supporting
confidence: 82%
“…In general, besides the orientation of the Ga-N bonds, there is no crystal structure difference between the Ga-polar and N-polar GaN nanorods. However, different polar surfaces induce different surface chemical reactivity, which is important, e.g., in the case of the impurity doping, 55,56 dopant incorporation, 57,58 surface reaction with gas, 59 and growth morphology of the GaN nanorods. 39,42 There are already numerous investigations reported on two-dimensional GaN layers with different polarities concerning these topics.…”
Section: B Catalyst-free Gan Nanorod Growthmentioning
confidence: 99%
“…Li et al investigated the impact of polarity by changing the nucleation conditions in direct MBE growth on sapphire prior to Mg doping. 18 Li et al found that Mg-doped N-face films have higher defect densities and are more resistive than the p-type films achievable for Ga-face growth. Beyond simply preventing undesirable polarity inversion, understanding the mechanism responsible for inversion allows the potential for controllably changing polarity in a single epitaxial growth.…”
mentioning
confidence: 99%