2003
DOI: 10.1116/1.1589511
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Polarity control during molecular beam epitaxy growth of Mg-doped GaN

Abstract: Mg doping has been found in some situations to invert growth on Ga-face GaN to N-face. In this study, we clarified the role the Ga wetting layer plays in rf plasma molecular beam epitaxy of GaN when Mg doping, for [Mg] from ∼2×1019 to ∼1×1020 cm−3 corresponding to the useful, accessible range of hole concentrations of p∼1017–1018 cm−3. Structures were grown in the N-rich and Ga-rich growth regime for single Mg doping layers and for multilayer structures with a range of Mg concentrations. Samples were character… Show more

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Cited by 45 publications
(27 citation statements)
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“…15 Unfortunately, however, the formation energy of nitrogen vacancies is lowest in this condition 17 and as mentioned above, these defects will compensate free holes.…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…15 Unfortunately, however, the formation energy of nitrogen vacancies is lowest in this condition 17 and as mentioned above, these defects will compensate free holes.…”
mentioning
confidence: 99%
“…18 Attempts to solve this problem with higher Mg fluxes cause the local polarity to invert from Ga-polar to N-polar, 3,15 and results in reduced Mg incorporation. Furthermore, the formation energy of nitrogen vacancies decreases under slightly Ga-rich conditions and as a result more nitrogen vacancies are available to compensate the free holes.…”
mentioning
confidence: 99%
“…Specifically, the presence of a Ga wetting layer on the surface during growth is found to lead to Ga-face polarity, while the absence of such a wetting layer results in N-face growth. 7 By adjusting the Ga:N flux ratio during MBE growth, the presence and spatial distribution of a Ga wetting layer on the surface can be controlled, and hence fully Ga-face growth, fully N-face growth, or an intermediate situation with regions of each polarity can be achieved. For these studies, three samples were employed, grown with Ga fluxes of 3.3 ϫ 10 −7 , 3.1ϫ 10 −7 , and 2.9ϫ 10 −7 Torr.…”
Section: Methodsmentioning
confidence: 99%
“…5 Finally, the crystal polarity during growth of GaN by molecular-beam epitaxy ͑MBE͒ has been observed to invert from Ga face to N face upon exposure to Mg; 6 the observed polarity inversion has been found to be dependent on the Ga:N flux ratio, with decreased Ga flux leading to inversion of polarity from Ga face to N face. 7 Given the difficulties associated with efficient acceptor doping of GaN, an understanding of the relationships among active acceptor concentration, the existence and spatial distribution of defects, crystal polarity, and other factors is critical. In this article we describe spatially resolved studies of local electronic structure in p-type GaN as a function of crystal polarity and in the vicinity of inversion domain boundaries.…”
Section: Introductionmentioning
confidence: 99%
“…A surfactant effect [5] is observed for coverages up to a 1 4 monolayer (ML), while a 1 4 to 1 2 ML coverage yields p-type doping, yet limited [6]. A coverage beyond 1 ML generates structural defects and a very rough growth front [7], that may cause a polarity inversion (Npolarity) [7][8][9][10], leading to a sharp reduction of the Mg incorporation [11].…”
Section: Introductionmentioning
confidence: 99%