1990
DOI: 10.1016/0022-0248(90)90836-a
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Surface migration and reaction mechanism during selective growth of GaAs and AlAs by metalorganic chemical vapor deposition

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Cited by 49 publications
(18 citation statements)
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“…Flatness of the growth plane at the mask edge therefore degrades when aluminum content is higher (aluminum composition: 0.48). Similar results concerning the growth plane at the mask edge were obtained for GaAs/AlGaAs selective growth [14,15]. Fig.…”
Section: Article In Presssupporting
confidence: 85%
“…Flatness of the growth plane at the mask edge therefore degrades when aluminum content is higher (aluminum composition: 0.48). Similar results concerning the growth plane at the mask edge were obtained for GaAs/AlGaAs selective growth [14,15]. Fig.…”
Section: Article In Presssupporting
confidence: 85%
“…10 This figure also plots the surface migration length of GaAs on SiO 2 from Ref. 19. Clearly, the surface migration length of GaAs on SiO 2 is for all temperatures much larger than the pitch of the nanostructured islands (500 nm) so the growth species has an adequate migration length for selective growth as indicated in Fig.…”
Section: Methodsmentioning
confidence: 94%
“…The higher lateral growth mode on the side (-110) facet of the AlGaAs NW could also be explained by a stronger bonding between Al and As atoms than that between Ga and As atoms in GaAs growth [25]. Another study describes that Al reacts with SiO 2 more than Ga does and the migration length of Al atoms (and growth species bonded with Al) was shorter than Ga [26]. Both reports state that the diffusion (migration) length becomes shorter as the temperature is lowered.…”
Section: Algaas Nanowirementioning
confidence: 96%