2005
DOI: 10.1016/j.jcrysgro.2004.12.110
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InGaAlAs selective-area growth on an InP substrate by metalorganic vapor-phase epitaxy

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Cited by 39 publications
(21 citation statements)
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“…This implies that in our growth conditions, aluminum has a shorter diffusion length than gallium. This is in contradiction with previous reports of a longer diffusion length for Al precursor than for Ga and In ones [4,11]. Fitting the experimental thickness profiles for InP, GaAs (Fig.…”
Section: Resultscontrasting
confidence: 99%
“…This implies that in our growth conditions, aluminum has a shorter diffusion length than gallium. This is in contradiction with previous reports of a longer diffusion length for Al precursor than for Ga and In ones [4,11]. Fitting the experimental thickness profiles for InP, GaAs (Fig.…”
Section: Resultscontrasting
confidence: 99%
“…As shown in Figure 3j, the indium content increases along the growth direction due to the higher rate of indium incorporation, since it has a much longer surface diffusion length than that of the Ga adatom. 13,14 Moreover, since the dissociation rate of indium is proportional to the growth temperature, the upper QWs, which have a slightly lower surface temperature, can contain more indium than the lower QWs. Therefore, the upper QWs can have a higher indium content than the lower QWs.…”
mentioning
confidence: 99%
“…The GaAsSb growth is considered to mainly proceed by the diffusion of Ga species from the mask region and migration on the sidewalls of InAs NWs. Since Ga atoms have a shorter migration length than that of In atoms, the temperature of 430 °C is probably too low to provide sufficient kinetic energy to the Ga species. The tapered sidewall formed as a result.…”
Section: Resultsmentioning
confidence: 99%