2017
DOI: 10.3103/s1067821217060098
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Surface Composition and Structure of Highly Porous Materials Based Zirconia Stabilized with Yttria

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Cited by 4 publications
(2 citation statements)
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“…The phase content of cubic, tetragonal and monoclinic phases in the ScAlSZ thin films were calculated using the relation between the most characteristic peaks of the Raman spectra [21]. Further, the factor k [22,23] was used during the calculation of the phase ratio, where k is the factor converting intensities between XRD and Raman spectra of the reference materials. The positions of Raman peaks were determined by fitting the data to the Lorentz line shape using a peak fit option in the OriginPro 2016 software.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The phase content of cubic, tetragonal and monoclinic phases in the ScAlSZ thin films were calculated using the relation between the most characteristic peaks of the Raman spectra [21]. Further, the factor k [22,23] was used during the calculation of the phase ratio, where k is the factor converting intensities between XRD and Raman spectra of the reference materials. The positions of Raman peaks were determined by fitting the data to the Lorentz line shape using a peak fit option in the OriginPro 2016 software.…”
Section: Methodsmentioning
confidence: 99%
“…The positions of Raman peaks were determined by fitting the data to the Lorentz line shape using a peak fit option in the OriginPro 2016 software. The phase ratio calculations were done according to the formula [21][22][23]:…”
Section: Methodsmentioning
confidence: 99%