2006
DOI: 10.1149/1.2159295
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Surface Charge Density of Unpassivated and Passivated Metal-Catalyzed Silicon Nanowires

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Cited by 116 publications
(107 citation statements)
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“…Hence, the substantial change in transport properties can be associated with removal of the surface layer in the small diameter NWs. These diameter dependent results could arise from several factors, including (i) diameter-dependent dopant incorporation during growth, (ii) dielectric confinement (24,25), and (iii) surface depletion (26,27), although results indicate that (i) is the dominant factor. The dielectric confinement model predicts that dopant ionization energy will increase with decreasing NW diameter, which could deplete small diameter NWs.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Hence, the substantial change in transport properties can be associated with removal of the surface layer in the small diameter NWs. These diameter dependent results could arise from several factors, including (i) diameter-dependent dopant incorporation during growth, (ii) dielectric confinement (24,25), and (iii) surface depletion (26,27), although results indicate that (i) is the dominant factor. The dielectric confinement model predicts that dopant ionization energy will increase with decreasing NW diameter, which could deplete small diameter NWs.…”
Section: Resultsmentioning
confidence: 99%
“…Surface Depletion. Surface depletion is a general phenomenon expected in planar (34) and NW (26,27) devices because of states at the Si/SiO x interface that trap carriers. The thickness of the surface depletion layer is governed by the interface trap density and dopant/carrier concentration (26,34).…”
Section: Nw Surface Oxidation and Etchingmentioning
confidence: 99%
“…Experimental proof of this effect in semiconducting NWs was observed by photoconductivity or capacitancevoltage measurements. [7][8][9][10] In this letter, we present our results on the influence of surfaces on GaAs NWs measured by low temperature microphotoluminescence ͑-PL͒ spectroscopy. A systematic comparison is done between unpassivated NWs and those that were capped with a shell of Al 0.4 Ga 0.6 As.…”
mentioning
confidence: 99%
“…This is because of several issues such as nanowire size fl uctuations, which can affect bandgap and barrier heights, especially for ultra-scaled (sub-20 nm diameter) nanowires; 4,5 dopant fl uctuations, where a dopant concentration difference of only a few atoms signifi cantly alters the interface and wire size, affecting the bandgap; 6 and surface states that have been observed in Si nanowires covered with thermal oxides. 7,8 Despite these challenges, some nice work has been shown recently on single nanowire devices. For example, Woodruff et al fabricated Si nanowire diodes with Ni and Ni 2 Si contacts on n -type Si.…”
Section: Contacts To Nanowiresmentioning
confidence: 99%