Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy

Hong, Jae Won; Noh, Keum Hwan; Park, Sang-Il; Kwun, Sook‐Il; Khim, Z. G.

doi:10.1103/physrevb.58.5078

Cited by 139 publications

(96 citation statements)

References 23 publications

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“…The presence of the electrostatic forces hypothesis is also supported by observations of nonpiezoelectric surfaces. 32 In contrast, the existence of a lateral PFM signal [33][34][35] and the absence of relaxation behavior in PFM contrast as opposed to SSPM contrast, 36,25 as well as numerous observations using both EFM-SSPM and PFM, 37,38 clearly point to a significant electromechanical contribution to PFM contrast. In order to resolve the controversy regarding the origins of PFM contrast, we analyze the contrast formation mechanism and relative magnitudes of electrostatic versus electromechanical contributions to PFM interactions for the model case of c ϩ , c Ϫ domains in tetragonal perovskite ferroelectrics.…”

Section: Introductionmentioning

confidence: 86%

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

2002

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In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytical descriptions of the complex interactions between a small tip and ferroelectric surface are derived for several sets of limiting conditions. Image charge calculations are used to determine potential and field distributions at the tip-surface junction between a spherical tip and an anisotropic dielectric half plane. Methods of Hertzian mechanics are used to calculate the response amplitude in the electrostatic regime. In the electromechanical regime, the limits of strong (classical) and weak (field-induced) indentation are established and the relative contributions of electroelastic constants are determined. These results are used to construct ''piezoresponse contrast mechanism maps'' that correlate the imaging conditions with the PFM contrast mechanisms. Conditions for quantitative PFM imaging are set forth. Variable-temperature PFM imaging of domain structures in BaTiO 3 and the temperature dependence of the piezoresponse are compared with GinzburgDevonshire theory. An approach to the simultaneous acquisition of piezoresponse and surface potential images is proposed. In order to determine the origin of image contrast in piezoresponse force microscopy ͑PFM͒, analytical descriptions of the complex interactions between a small tip and ferroelectric surface are derived for several sets of limiting conditions. Image charge calculations are used to determine potential and field distributions at the tip-surface junction between a spherical tip and an anisotropic dielectric half plane. Methods of Hertzian mechanics are used to calculate the response amplitude in the electrostatic regime. In the electromechanical regime, the limits of strong ͑classical͒ and weak ͑field-induced͒ indentation are established and the relative contributions of electroelastic constants are determined. These results are used to construct ''piezoresponse contrast mechanism maps'' that correlate the imaging conditions with the PFM contrast mechanisms. Conditions for quantitative PFM imaging are set forth. Variable-temperature PFM imaging of domain structures in BaTiO 3 and the temperature dependence of the piezoresponse are compared with Ginzburg-Devonshire theory. An approach to the simultaneous acquisition of piezoresponse and surface potential images is proposed.

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Section: Introductionmentioning

confidence: 86%

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

2002

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“…The electrostatic effect originates essentially from the Coulombic electrostatic force between the 8 AFM tip/cantilever and the sample surface, [75,76] described as [77,78] .…”

Section: Fig 3 Local and Non-local Electrostatic Effects In The Afmmentioning

confidence: 99%

Non-piezoelectric effects in piezoresponse force microscopy

Seol¹,

Kim²,

Kim³

2017

Current Applied Physics

131

114

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Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.

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“…For the same experimental setup the term "dynamic-contact electrostatic force microscopy" (DC-EFM) was introduced and domain contrast was explained by specific electrical properties of the +z and the −z domain faces [19]. Differences in the work functions were also proposed for causing the domain contrast [20].…”

mentioning

confidence: 99%

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

Jungk

Hoffmann

Soergel

2006

Applied Physics Letters

120

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The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.

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Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy

Cited by 139 publications

References 23 publications

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

Non-piezoelectric effects in piezoresponse force microscopy

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

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