Super-resolution AFM imaging based on compressive sensing

Han, Guoqiang; Lv, Luyao; Yang, Gaopeng; Niu, Yixiang

doi:10.1016/j.apsusc.2019.145231

Cited by 8 publications

(5 citation statements)

References 23 publications

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“…All these parameters will affect the overall image acquisition duration and future image resolution (Figure 3). The most popular imaging strategy is to start from a sparse, large field-of-view image, possibly interpolated by AI-enabled algorithms [17]. After that, the smaller region of interest is selected for high-resolution imaging (Figure 4).…”

Section: Background Of the Atomic Force Microscopementioning

confidence: 99%

“…Before imaging, a few scanning parameters must be chosen: the size of th view, the scanning mode and speed, and the number of lines and points in each these parameters will affect the overall image acquisition duration and future im olution (Figure 3). The most popular imaging strategy is to start from a sparse, la of-view image, possibly interpolated by AI-enabled algorithms [17]. After that, th region of interest is selected for high-resolution imaging (Figure 4).…”

Section: Background Of the Atomic Force Microscopementioning

confidence: 99%

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Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

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In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Information from scientific articles published over the last 5 years is provided. Many articles in this period disclose minor amendments in the mechanical system but suggest innovative AFM control and imaging algorithms. Some of them are based on artificial intelligence. During operation, control of cantilever dynamic characteristics can be achieved by magnetic field, electrostatic, or aerodynamic forces.

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Section: Background Of the Atomic Force Microscopementioning

confidence: 99%

Section: Background Of the Atomic Force Microscopementioning

confidence: 99%

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

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“…Some areas are more important than others for the quantities that we would like to obtain from the measurement. Development of better sampling can focus on better treatment of steep edges on the surface [ 154 ], reduction in the number of data points via compressed sensing [ 155 ], or better statistical coverage of roughness [ 8 ].…”

Section: Synthetic Data Applicationsmentioning

confidence: 99%

Synthetic Data in Quantitative Scanning Probe Microscopy

Nečas

Klapetek

2021

Nanomaterials

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Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.

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“…Other software tools, such as TopoStats, have been developed to identify and track specific biomolecules from AFM images [16]. In addition to the AFM software mentioned above, in some works analyzed the AFM data to improve the image resolution [17][18][19] or to increase the AFM scan speed [20]. The most popular free software packages for AFM image processing, such as Gwyddion [21] and WSxM [22], have limitations in reading and reconstruct only the data generated by the commercial AFM systems.…”

Section: Introductionmentioning

confidence: 99%

AFMDAQ Visualizer: Software and guide to reconstruct and analyze images with raw external data acquisition from the atomic force microscopies

Fernandez Brito,

Murillo Bracamontes,

Enriquez Flores

et al. 2024

Preprint

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Atomic force microscopy (AFM) serves as a versatile tool widely employed for the micro- and nanoscale characterization of materials, offering valuable insights into their morphology and physical properties. Despite the proposal of numerous new AFM technologies each year, engineers and researchers encounter a primary challenge in the efficient external acquisition of data and subsequent image reconstruction. Additionally, most AFM users are constrained to analyzing images provided by commercial scanning probe microscopes. However, by acquiring real raw data from the AFM, comprehensive studies of topography and physical properties become feasible. This paper presents a comprehensive guide to external data capture using data acquisition cards and image reconstruction for topographical and physical properties analysis. Furthermore, open-source programs for data acquisition and analysis (AFMDAQ Visualizer) have been developed with a specific focus on advancing external modes in AFM. The discussion encompasses key methodologies and essential tools aimed at enhancing AFM capabilities across diverse research applications.

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Super-resolution AFM imaging based on compressive sensing

Cited by 8 publications

References 23 publications

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Synthetic Data in Quantitative Scanning Probe Microscopy

AFMDAQ Visualizer: Software and guide to reconstruct and analyze images with raw external data acquisition from the atomic force microscopies

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