Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Abstract

In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Information from scientific articles published over the last 5 years is provided. Many articles in this period disclose minor amendments in the mechanical system but suggest innovative AFM control and imaging algorithms. Some of them are based on artificial intelligence. During operation, control of cantilever dynamic characteristics can be achieved by magnetic field, electrostatic, or aerodynamic forces.

Atomic Force Microscopy Applied to the Study of Tauopathies

“…AFM relies on measuring forces between a small tip (typically a few nanometers in size) and the sample surface, and subsequently, its transformation into an image that reveals the three-dimensional topographic characteristics of the surface from which mechanical, electrical, and magnetic properties can be obtained . Probes are usually made of silicon, silicon dioxide, or silicon nitride, which are produced using nanofabrication processes. , In this scenario, the interaction forces can be van der Waals, electrostatic, magnetic, or other interactions depending on the nature of the sample and tip . The main components that make up an AFM are a probe (cantilever and tip), piezoelectric scanner, which moves the sample or cantilever in three directions, laser, photodetector, and computer for system control, storage of data produced by the photodetector and conversion of these data on three-dimensional topographic maps .…”

“…27 Probes are usually made of silicon, silicon dioxide, or silicon nitride, which are produced using nanofabrication processes. 28,29 In this scenario, the interaction forces can be van der Waals, electrostatic, magnetic, or other interactions depending on the nature of the sample and tip. 27 The main components that make up an AFM are a probe (cantilever and tip), piezoelectric scanner, which moves the sample or cantilever in three directions, laser, photodetector, and computer for system control, storage of data produced by the photodetector and conversion of these data on threedimensional topographic maps.…”