2024
DOI: 10.1021/acschemneuro.3c00819
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Atomic Force Microscopy Applied to the Study of Tauopathies

Maria do Socorro do Nascimento Amorim,
Álefe Roger Silva França,
Ralph Santos-Oliveira
et al.

Abstract: Atomic force microscopy (AFM) is a scanning probe microscopy technique which has a physical principle, the measurement of interatomic forces between a very thin tip and the surface of a sample, allowing the obtaining of quantitative data at the nanoscale, contributing to the surface study and mechanical characterization. Due to its great versatility, AFM has been used to investigate the structural and nanomechanical properties of several inorganic and biological materials, including neurons affected by tauopat… Show more

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