2000
DOI: 10.1006/jcis.2000.6881
|View full text |Cite
|
Sign up to set email alerts
|

Substrate Morphology and Particle Adhesion in Reacting Systems

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

3
80
0

Year Published

2002
2002
2023
2023

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 70 publications
(83 citation statements)
references
References 23 publications
3
80
0
Order By: Relevance
“…This model was applied to colloid probe measurements between polystyrene spheres and a silicon wafer at different pH values that caused different surface roughness [559] and measured adhesion forces agreed much better with this model than with DLVO theory of a sphere/plane geometry. On the basis of this model, Cooper et al [351,560] generated computer representations of surface topographies as obtained by AFM imaging by distributions of hemispherical asperities and simulated adhesion forces between these surfaces.…”
Section: Influence Of Roughness On Adhesionmentioning
confidence: 90%
“…This model was applied to colloid probe measurements between polystyrene spheres and a silicon wafer at different pH values that caused different surface roughness [559] and measured adhesion forces agreed much better with this model than with DLVO theory of a sphere/plane geometry. On the basis of this model, Cooper et al [351,560] generated computer representations of surface topographies as obtained by AFM imaging by distributions of hemispherical asperities and simulated adhesion forces between these surfaces.…”
Section: Influence Of Roughness On Adhesionmentioning
confidence: 90%
“…VDW forces are important to quantify in adhesion studies because they are always present and are always attractive. VDW forces dominate the interaction of particles in contact with thin films (6)(7)(8)(9) and can also be the controlling forces in film adhesion, contributing to adhesive or cohesive film failure (9). Within the equation that describes VDW forces, the Hamaker constant is a key parameter that describes how strongly two materials interact.…”
Section: Introductionmentioning
confidence: 99%
“…The adhesion forces were also measured by bringing the spheres into contact with the surface and measuring the force required to pull them off. An adhesion model described elsewhere was used to interpret these pull-off measurements (6)(7)(8). This model isolates the contribution of the geometry, morphology, and mechanical properties of the two surfaces to the adhesion force, so that the VDW forces between the surfaces can be described and the Hamaker constant can be determined.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…However, for particles with rough surfaces within the same size range, the particle size can be replaced by the surface roughness in estimating the influence of the adhesion force because real contact occurs only at the tips of the surface asperities [15]. It is emphasized that the particle size, which is part of the Bond number calculation, is still the dominant factor; however, the surface roughness has a significant effect on the adhesion force of up to orders of magnitude [16][17][18]. For particles of diameter 10-100 µm, it has been shown that the measured adhesion force is smaller than the theoretical due to reduction in contact area as a result of surface roughness [19,20].…”
Section: Introductionmentioning
confidence: 99%