Sub-pixel resolution with a color X-ray camera

Nowak, S.; Bjeoumikhov, A.; Borany, J. von; Buchriegler, Josef; Munnik, F.; Petrič, M.; Radtke, Martin; Renno, Axel D.; Reinholz, Uwe; Scharf, Oliver; Wedell, R.

doi:10.1039/c5ja00028a

Cited by 24 publications

(19 citation statements)

References 22 publications

(30 reference statements)

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“…Calculations results of are given in figures 3-5 and in tables 2-5 [16][17][18][19][20][21]. Finding the radiation defects concentration area of result at ionic radiation has allowed to find this area's behavior regularities.…”

Section: Resultsmentioning

confidence: 99%

Optimization calculation algorithms on cascade and probabilistic functions and radiation defects concentration at the ionic radiation

Komarov

Шмыгалева

Akanbay

et al. 2019

Int. j. math. phys.

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Work is performed within a cascade and probabilistic method which essence consists in receiving and further usage of the cascade and probabilistic functions (CPF) for various particles. CPF make sense to probability that the particle generated at some depth of h' will reach a certain depth of h after n number of impacts. In work optimization calculation algorithms of the cascade and probabilistic functions (CPF) depending on interactions number and particles penetration depth is offered, concentration of radiation defects at ionic radiation for the purpose of reduction calculation time and quality. For calculation CPF and concentration radiation defects there is an area of result, border of this area and a calculation step. Borders and a calculation step selection automation is executed.

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Section: Resultsmentioning

confidence: 99%

Optimization calculation algorithms on cascade and probabilistic functions and radiation defects concentration at the ionic radiation

Komarov

Шмыгалева

Akanbay

et al. 2019

Int. j. math. phys.

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“…In most cases, the charge is split over several pixels. With a correct analysis of the charge distribution, sub-pixel coordinates of a photon hit can be retrieved [9] .…”

Section: Sub-pixel Resolutionmentioning

confidence: 99%

Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X‐ray camera

et al. 2015

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We present results of recent development of the color X-ray camera, type SLcam r , allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam r can go down to nearly 5 m. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam r is used as particle-induced X-ray emission detector.

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“…Detailed information on the underlying concept, possible limitations, and results on experimental data from different CXC systems are already published …”

Section: Challenges and Approachesmentioning

confidence: 99%

Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

et al. 2018

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The combination of a pn‐junction charge‐coupled device‐based pixel detector with a poly‐capillary X‐ray optics was installed and examined at the Helmholtz‐Zentrum Dresden‐Rossendorf. The set‐up is intended for particle‐induced X‐ray emission imaging to survey the trace elemental composition of flat/polished geological samples. In the standard configuration, a straight X‐ray optics (20 μm capillary diameter) is used to guide the emitted photons from the sample towards the detector with nearly 70 000 pixels. Their dimensions of 48 × 48 μm2 are the main limitation of the lateral resolution. This limitation can be bypassed by applying a dedicated subpixel algorithm to recalculate the footprint of the photon's electron cloud in the detector. The lateral resolution is then mainly determined by the capillary's diameter. Nevertheless, images are still superimposed by the X‐ray optics pattern. The optics' capillaries are grouped in hexagonal bundles resulting in a reduced transmission of X‐rays in the boundary regions. This influence can be largely suppressed by combining a series of short measurements at slightly shifted positions using a precision stage and correcting the image data for this shifting. The use of a subpixel grid for the image reconstruction allows a further increase of the spatial resolution. This approach of image‐stacking and multiframe super‐resolution in combination with the subpixel correction algorithm is presented and illustrated with experimental data. Additionally, a flat‐field correction is shown to remove the remaining imaging inhomogeneity caused by non‐uniform X‐ray transmission. The described techniques can be used for all X‐ray spectrometry methods using an X‐ray camera to obtain high‐quality elemental images.

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Sub-pixel resolution with a color X-ray camera

Cited by 24 publications

References 22 publications

Optimization calculation algorithms on cascade and probabilistic functions and radiation defects concentration at the ionic radiation

Optimization calculation algorithms on cascade and probabilistic functions and radiation defects concentration at the ionic radiation

Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X‐ray camera

Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

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