Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

Buchriegler, Josef; Klingner, Nico; Hanf, Daniel; Munnik, F.; Nowak, S.; Scharf, Oliver; Ziegenrücker, René; Renno, Axel D.; Borany, J. von

doi:10.1002/xrs.2946

Cited by 3 publications

(1 citation statement)

References 21 publications

(41 reference statements)

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“…The idea is to test the Full-Field Particle Induced X-ray Emission with a large area detector. This technique has been tried with 15 × 15 mm 2 CCD-based detectors [92,93] and it will be a very interesting experiment to carry out in Pelletron.…”

Section: Full Field Particle Induced X-ray Emissionmentioning

confidence: 99%

X-Ray fluorescence imaging system based on Thick-GEM detectors

Souza¹

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AgradecimentosEste trabalho recebeu apoio financeiro da Fundação de Amparo à Pesquisa do Estado de São Paulo, com a bolsa FAPESP 2017/00426-9.My sincere thanks to the whole GDD lab at CERN, in special Leszek Ropelewski, Eraldo Oliveri, Patrik Thuiner and Florian Brunbauer.Gostaria de agradecer primeiramente ao professor Alexandre Suaide, por me introduzir ao grupo e pela ajuda nos mais diversos assuntos. À professora Marcia Rizzuto e à minha amiga Hellen Santos, pelo interesse nesse trabalho e troca de informações.Aos professores Marco Bregant, Marcelo Munhoz, Nelson Carlin, Tiago Fiorini, Mauro Cosentino e Zwinglio Guimarães pelas ideias e sugestões, tornando esse trabalho muito mais completo.Ao meu orientador e amigo, Hugo Natal da Luz, pelos ensinamentos, conselhos e paciência. Aos amigos que fiz durante a graduação e o mestrado, pela diversão, aprendizado e companhia durante todos esse anos. Um agradecimento especial aos amigos do grupo, Henrique, Milton, Camila, Chiara, Thais e Lucas. À minha familia, meus pais, Marco Aurélio e Maria Cabrine, e meu irmão Ramon, por toda confiança e suporte. Vocês são os melhores exemplos para mim. À Mayumi, pelo carinho e por estar ao meu lado nos melhores e piores momentos."All we have to decide is what to do with the time that is given us." -J.R.R. Tolkien, The Lord of The Rings Abstract GEMs (Gas Electron Multiplier) and Thick-GEMs (Thick-Gas Electron Multiplier) are MPGDs (Micropattern Gas Detector) that make part of the new generation of gaseous detectors, allowing high counting rates, low cost when compared to solid state detectors, high radiation hardness and gain when using multiple structures. Besides that, the handling and maintenance of these detectors is relatively simple, being versatile to detect different types of radiation. Therefore, these detectors are an effective alternative to build imaging systems with large sensitive area. This work consists in the study and characterization of a set of gaseous detectors, more specifically the Thick-GEMs produced in the High Energy Physics and Instrumentation Center at IFUSP, which were tested showing promising results in terms of gain, energy resolution and operational stability. However, due to the low signal-to-noise ratio of the Thick-GEMs, the X-ray fluorescence imaging system was mounted using GEMs. During this work the necessary software tools for image processing and reconstruction were developed as a parallel study in computational simulations to better understand the operation of gaseous detectors.X-ray fluorescence techniques are essential in areas such as medicine and the study of historical and cultural heritage since they are non-invasive and non-destructive. Techniques to check the authenticity of masterpieces are required and museums are gradually becoming more interested in the Physics and instrumentation needed to characterize their patrimony.

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Section: Full Field Particle Induced X-ray Emissionmentioning

confidence: 99%

X-Ray fluorescence imaging system based on Thick-GEM detectors

Souza¹

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Comparison of three reconstruction methods based on deconvolution, iterative algorithm and neural network for X-ray fluorescence imaging with coded aperture optics

Kulow

Buzanich

Reinholz

et al. 2020

J. Anal. At. Spectrom.

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BAMline—A real-life sample materials research beamline

Guilherme Buzanich,

Radtke,

Yusenko

et al. 2023

The Journal of Chemical Physics

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With increasing demand and environmental concerns, researchers are exploring new materials that can perform as well or better than traditional materials while reducing environmental impact. The BAMline, a real-life sample materials research beamline, provides unique insights into materials’ electronic and chemical structure at different time and length scales. The beamline specializes in x-ray absorption spectroscopy, x-ray fluorescence spectroscopy, and tomography experiments. This enables real-time optimization of material properties and performance for various applications, such as energy transfer, energy storage, catalysis, and corrosion resistance. This paper gives an overview of the analytical methods and sample environments of the BAMline, which cover non-destructive testing experiments in materials science, chemistry, biology, medicine, and cultural heritage. We also present our own synthesis methods, processes, and equipment developed specifically for the BAMline, and we give examples of synthesized materials and their potential applications. Finally, this article discusses the future perspectives of the BAMline and its potential for further advances in sustainable materials research.

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Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts

Cited by 3 publications

References 21 publications

X-Ray fluorescence imaging system based on Thick-GEM detectors

X-Ray fluorescence imaging system based on Thick-GEM detectors

Comparison of three reconstruction methods based on deconvolution, iterative algorithm and neural network for X-ray fluorescence imaging with coded aperture optics

BAMline—A real-life sample materials research beamline

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