“…Tensile strain is also expected to change the curvatures of the conduction band valleys, leading to decreased electron effective mass. ,,, This is similar to the reduced electron effective mass with strain in silicon nMOS transistors, which leads to increased mobility. , Applying tensile strain to 2D transistors has also been suggested to lower Schottky barriers at the source and drain contacts, ,, potentially leading to lower contact resistance. However, because our devices have relatively long channels and our improvements in μ FE and I D do not depend on channel length (see Supporting Information Figure S7), we expect the contribution of contact resistance in our measurements to be relatively small . Thus, we believe that the electrical performance improvements observed here are mostly related to electronic transport in the MoS 2 channel, i.e., lower intervalley scattering and effective mass.…”