Study of the Efficiency of Microcantilevers: Cases of Electrothermal and Electromagnetic Actuation

Pruchnik, Bartosz; Piasecki, Tomasz; Orłowska, Karolina; Majstrzyk, Wojciech; Sierakowski, Andrzej; Gotszalk, Teodor; Rangelow, Ivo W.

doi:10.1109/jmems.2022.3187793

Cited by 4 publications

(2 citation statements)

References 17 publications

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“…Additionally, there is no lateral contact force between the probe and the surface, so it is possible to investigate more fragile surfaces (e.g., biofilms, proteins) in this mode 37 . Among the AFM modes, there is also a place for mixed techniques, which combine properties of both contact and non-contact, e.g., a tapping mode in which the probe touches the surface only at specific points, see, e.g., for details 38 – 42 .…”

Section: Experimental Procedures and Methodsmentioning

confidence: 99%

Wavelet-based information theory in quantitative assessment of AFM images’ quality

Pruchnik,

Putek,

Gotszalk

2024

Sci Rep

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The quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality. Specifically, we propose quantifying the loss of image information due to the various distortion processes by exploring the relationship between image information based on the information channel capacity (ICC), spectral image representation, and visual quality. Since the ideal image is unavailable, the power and noise spectrum, the critical input information for the image quality evaluation, must be robustly estimated in the proposed method. The classical, most popular Welch method for spectral estimation uses an average of several windowed periodograms and can produce biased spectrum estimates. Therefore, in our work, we discuss an alternative technique based on the wavelet transform that can be applied to solve this challenging problem, specifically in the case of noisy, uncertain AFM measurements. Finally, we validate the performance of the enhanced ICC-wavelet-based algorithm with noisy measurement AFM data.

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Section: Experimental Procedures and Methodsmentioning

confidence: 99%

Wavelet-based information theory in quantitative assessment of AFM images’ quality

Pruchnik,

Putek,

Gotszalk

2024

Sci Rep

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“…In all the above mentioned solutions, the RTD nanoprobe is electrically biased, which leads to self-heating of the sensor, an effect that can generally be described as the so called back action phenomenon. Moreover, because SThM cantilevers are usually the multilayer structures, Joule heating in nanoprobe wiring induces parasitic structure deflection [6]. From that perspective, the entire measurement setup must be designed so as to ensure the highest SNR at the lowest possible sensor bias.…”

Section: Introductionmentioning

confidence: 99%

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Pruchnik,

Smagowski,

Badura

et al. 2024

Meas. Sci. Technol.

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Scanning probe microscopy (SPM) is a broad family of diagnostic methods. Common restraint of SPM is only surficial interaction with specimen, especially troublesome in case of complex volumetric systems, e.g. microbial or microelectronic. Scanning thermal microscopy (SThM) overcomes that constraint, since thermal information is collected from broader space. We present transformer bridge-based setup for resistive nanoprobe-based microscopy. With low-frequency (approx. 1 kHz) detection signal bridge resolution becomes independent on parasitic capacitances present in the measurement setup. We present characterization of the setup and metrological description – with resolution of the system 2 mK with sensitivity as low as 5 mV/K. Transformer bridge setup brings galvanic separation, enabling measurements in various environments, pursued for purposes of molecular biology. We present results SThM measurement results of high-thermal contrast sample of carbon fibers in an epoxy resin. Finally, we analyze influence of thermal imaging on topography imaging in terms of information channel capacity (ICC). We state that transformer bridge-based SThM system is a fully functional design along with low driving frequencies and resistive thermal nanoprobes by Kelvin Nanotechnology.

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Integration of piezoelectric and electrothermal actuators for high-resolution Atomic Force Microscopy

Nasrabadi,

Nikooienejad,

Vikrant

et al. 2024

Mechatronics

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Study of the Efficiency of Microcantilevers: Cases of Electrothermal and Electromagnetic Actuation

Cited by 4 publications

References 17 publications

Wavelet-based information theory in quantitative assessment of AFM images’ quality

Wavelet-based information theory in quantitative assessment of AFM images’ quality

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Integration of piezoelectric and electrothermal actuators for high-resolution Atomic Force Microscopy

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