Studies on Electrodeposited NiS Thin Films

Bharathi, B.; Thanikaikarasan, S.; Chandrasekar, P. V.; Kollu, Pratap; Mahalingam, T.; Ixtlilco, Luis

doi:10.14447/jnmes.v17i3.417

Cited by 5 publications

(8 citation statements)

References 18 publications

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“…The data obtained in this study are also in a good agreement with the previous reports in the literature on NiS films prepared by spray-pyrolysis and other techniques [6,14,15]. The unit cell parameters a, b and c, were determined using the following formula [16]:…”

Section: X-ray Diffractionsupporting

confidence: 89%

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Gahtar

Benramache

Ammari

et al. 2021

Annals of West University of Timisoara - Physics

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Nickel sulfide (NiS) thin film has been deposited on glass substrates by spray-pyrolysis at 325 ± 5 °C. The precursor aqueous solution was synthetized using hexahydrated nickel nitrates and thiourea. The structural, morphological, optical and electrical properties were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), UV-visible spectroscopy and four probes electrical measurements. The XRD analysis confirmed the hexagonal structure of NiS thin film, which was found to crystalize along [010] direction with an average crystallites size of 10.5 nm. The lattice parameters are a = b = 3.420 Å and c = 5.300 Å in the space group P63/mmc. The optical properties of the films were investigated through the transmittance and the reflectance measurements. The results revealed that the material exhibits a direct optical band gap of 1.03 eV. The elementary composition analysis confirmed the presence of Ni and S with a stoichiometry ratio (Ni/S) of 1.05. The morphology analysis revealed a homogenous crack-free, compact appearance and a granular surface in all scanned areas. The average roughness of the surface was 6.48 nm. On the other hand, the film exhibits a high electrical conductivity ca. 1.10 × 105 S/cm at room temperature. The above results show that the prepared NiS in this study has a good crystallization, dense morphology, good stoichiometric ratio and high conductivity; therefore, it stands as a potential candidate for application in supercapacitors as an electrode material.

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Section: X-ray Diffractionsupporting

confidence: 89%

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Gahtar

Benramache

Ammari

et al. 2021

Annals of West University of Timisoara - Physics

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“…In the inset of figure 1(a), Tauc plots associated to the absorption spectra of the representative compounds have been presented from where the bandgap could be estimated by extrapolating the linear region to the abscissa. Bandgap of the end members, namely NiS and CdS appeared as ∼0.7 and 2.3 eV, respectively, which matched well with the reported data [24,25]. Bandgap of the intermediate member (Ni 0.5 Cd 0.5 S) could be seen to be 1.8 eV which turned out to be higher than the arithmetic mean of the end-members' bandgaps (1.5 eV) implying a deviation from Vegard's law with a downward-concave nature of bandgap bowing.…”

Section: Observation Of Bandgap Bowingsupporting

confidence: 90%

“…In figure 1(a), we have presented the thickness-normalized optical absorption spectra of three representative compounds, namely pristine NiS, Ni 0.5 Cd 0.5 S alloy, and CdS. The pristine NiS film showed an absorption spectrum over the entire visible region without any excitonic peak; the absorbance extended toward shorter wavelength showing a tail in the NIR region [24]. With increasing cadmium-content, the materials exhibited a lesser NIR activity; an excitonic peak in addition appeared at around 480 nm, which is a well-defined feature of CdS thin-films and is known to appear due to an optical transition of the first excitonic state [25].…”

Section: Observation Of Bandgap Bowingmentioning

confidence: 99%

“…To obtain an insight of the influence of cadmium-doping on the crystal structure of NiS, we have characterized the Ni 1−x Cd x S thin-films through XRD studies; XRD patterns of the representative compounds are shown in figure 2. The pristine NiS compound evidenced crystallization of the thin-films in a hexagonal phase (α-phase) as indicated by characteristic 2θ values of 29.9 • , 34.4 • , 45.5 • , and 53.2 • representing the (100), (101), (102), and (110) planes, respectively (JCPDS file number: 75-0613) [13,24]. With introduction of cadmium, some additional peaks appeared in the XRD pattern along with the signature peaks of NiS.…”

Section: Observation Of Bandgap Bowingmentioning

confidence: 99%

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Reverse bandgap-bowing in nickel-cadmium sulfide alloys (Ni_1−xCd_xS) and its origin

Paramanik¹,

Chatterjee²,

Pal³

2021

J. Phys.: Condens. Matter

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We present evolution of band energies in α-NiS when alloyed with a cationic doping through isovalent cadmium (Cd2+). Optical bandgap of nickel-cadmium sulfide (Ni1−x Cd x S) alloys, as a deviation from the linear relationship or Vegard’s law, have exhibited a reverse bandgap-bowing in the form of downward-concave dependence. Such a phenomenon, which manifests as a negative value of bowing coefficient (b), is uncommon in chalcogenide alloys. In this work, we have deliberated on the origin of reverse bandgap-bowing in nickel-cadmium alloys and identified the band responsible for the bowing phenomenon. While thin-films of the alloys were formed through successive ionic layer adsorption and reaction method, tunnel conductance and thereby density of states of the materials were derived from scanning tunneling spectroscopy. The spectroscopy provided the variation of conduction and valence band-edges (CB and VB, respectively) with respect to the cadmium-content in Ni1−x Cd x S. The CB-edge of the alloys could be seen to remain mostly unaffected with increasing cadmium-content, since the band is composed of only the S 2p orbitals; the VB-energy, on the other hand, which forms due to an effective coupling between the metal d and the anion p orbitals, could be seen to be affected due to a p–d repulsion. Based on our experimental findings, we inferred that an antagonism between volume deformation and structural relaxation had resulted in the reverse bandgap-bowing in Ni1−x Cd x S alloys.

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“…It is observed that the reported values of the films are very close to each others. Furthermore, the unit cell volume decreases with the increase in the annealing time, owing to an improved crystal growth in the films [14]. This phenomenon shows that the annealing of the resulting layers has an essential role in the improvement of optical quality and electrical properties [15].…”

Section: X-ray Diffractionmentioning

confidence: 97%

Effect of annealing time on the structural, morphological, optical and electrical properties of NiS thin films

Gahtar¹,

Benali²,

Benramache³

et al. 2022

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In this work, we prepared thin films of nickel sulfide by spray pyrolysis on substrates of the glass at temperature of 300°C. The solution used is a mixture of nickel acetate and thiourea as a source of nickel and sulfur respectively, acetic acid was used as a complexing agent, and then heated the resulting layers in an ordinary furnace at 300°C at different times of 1h, 2h and 3h to study the annealing time effect on the physical and chemical properties. The characterization methods used indicate remarkable changes in the structural, electrical, morphological and optical properties of NiS films under annealing time. The results obtained have shown that the prepared NiS films contain good crystallization, dense morphology, good stochiometric ratio and high conductivity, and these specifications make them a potential candidate as electrode material for application in super-capacitors.

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Studies on Electrodeposited NiS Thin Films

Cited by 5 publications

References 18 publications

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Reverse bandgap-bowing in nickel-cadmium sulfide alloys (Ni_1−xCd_xS) and its origin

Effect of annealing time on the structural, morphological, optical and electrical properties of NiS thin films

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Studies on Electrodeposited NiS Thin Films

Cited by 5 publications

References 18 publications

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Study of the Structural, Optical, Electrical and Morphological Properties of Nickel Sulfide Thin Films Used in Supercapacitors

Reverse bandgap-bowing in nickel-cadmium sulfide alloys (Ni1−x Cd x S) and its origin

Effect of annealing time on the structural, morphological, optical and electrical properties of NiS thin films

Contact Info

Product

Resources

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Reverse bandgap-bowing in nickel-cadmium sulfide alloys (Ni_1−xCd_xS) and its origin