Effect of annealing time on the structural, morphological, optical and electrical properties of NiS thin films

Abstract

In this work, we prepared thin films of nickel sulfide by spray pyrolysis on substrates of the glass at temperature of 300°C. The solution used is a mixture of nickel acetate and thiourea as a source of nickel and sulfur respectively, acetic acid was used as a complexing agent, and then heated the resulting layers in an ordinary furnace at 300°C at different times of 1h, 2h and 3h to study the annealing time effect on the physical and chemical properties. The characterization methods used indicate remarkable changes in the structural, electrical, morphological and optical properties of NiS films under annealing time. The results obtained have shown that the prepared NiS films contain good crystallization, dense morphology, good stochiometric ratio and high conductivity, and these specifications make them a potential candidate as electrode material for application in super-capacitors.

Improvements in piezoelectric and energy harvesting properties with a slight change in depolarization temperature in modified BNKT ceramics by a simple technique

“…In the current work, the X-ray peak broadening (110) reflection was selected for this proposed, and the calculation was performed based on the Debye–Scherrer formula: 37 where λ is taken to be 0.15418 nm as the X-ray source is Cu-Kα, B is the full width at half maximum (FWHM), k is a fixed number 0.9, and θ is the Bragg's angle. 38–43 It can be seen that crystallite size increased from 12.54 nm for the unannealed ceramic to the maximum value of 15.05 nm for the 12 h annealed ceramic. With increasing annealing time, the FWHM of the (110) peak became narrower and the crystallite size increased, indicating an improvement in the degree of crystallinity of the annealed ceramics.…”

“…44,45 In addition, it was proposed that the increase in crystallite size could be accompanied by an improvement in the ceramic's electrical properties. 41,43…”

“…where l is taken to be 0.15418 nm as the X-ray source is Cu-Ka, B is the full width at half maximum (FWHM), k is a xed number 0.9, and q is the Bragg's angle. [38][39][40][41][42][43] It can be seen that crystallite size increased from 12.54 nm for the unannealed ceramic to the maximum value of 15.05 nm for the 12 h annealed ceramic.…”

“…44,45 In addition, it was proposed that the increase in crystallite size could be accompanied by an improvement in the ceramic's electrical properties. 41,43 To further analyze the evolution of the crystal structure with varying annealing times, Raman spectra were measured in the range of 100-1200 cm −1 , which are now presented in Fig. 2.…”

Growth and characterization of bimetallic (Ni,Co) sulfide thin films deposited by spray pyrolysis

“…The texture coefficient (TC hkl ) provides information about the probability of growth as a function of the orientation [hkl]. It is given by the formula [14]:…”