2014
DOI: 10.1134/s1063783414110286
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Structuring effect of heteroepitaxial CdHgTe/CdZnTe systems under irradiation with silver ions

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Cited by 8 publications
(7 citation statements)
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“…The deformation sign is dependent on the ratio of ionic radii r + of the matrix atoms and introduced impurity [ 21 ]. Implantation with ions of small radius (such as B + , r B ~ 0.97 Ǻ) stimulates the compression of the damaged layer, whereas the implantation with ions of radius comparable with that of Hg (in our case, these are Ag + ions, r Ag ~ 1.44 Ǻ, r Hg ~ 1.55 Ǻ) gives rise to tensile stress in the damaged layer, as confirmed by the X-ray diffraction data obtained in this work and in our previous work [ 23 , 34 ]. The calculated mechanical stress is σ Ag = 2.2 × 10 5 Pa (strain ε ~ 10 −6 ) and σ B = 1.4 × 10 3 Pa (strain ε ~ 10 −8 ) [ 25 ].…”
Section: Discussionsupporting
confidence: 90%
“…The deformation sign is dependent on the ratio of ionic radii r + of the matrix atoms and introduced impurity [ 21 ]. Implantation with ions of small radius (such as B + , r B ~ 0.97 Ǻ) stimulates the compression of the damaged layer, whereas the implantation with ions of radius comparable with that of Hg (in our case, these are Ag + ions, r Ag ~ 1.44 Ǻ, r Hg ~ 1.55 Ǻ) gives rise to tensile stress in the damaged layer, as confirmed by the X-ray diffraction data obtained in this work and in our previous work [ 23 , 34 ]. The calculated mechanical stress is σ Ag = 2.2 × 10 5 Pa (strain ε ~ 10 −6 ) and σ B = 1.4 × 10 3 Pa (strain ε ~ 10 −8 ) [ 25 ].…”
Section: Discussionsupporting
confidence: 90%
“…The surface becomes enriched with heavier components of the Cd-HgTe solid solution such as Hg. This scenario agrees with the results of a X-ray diffraction analysis of Cd-HgTe films with the composition = 0.23 irradiated by 100-keV silver ions [18], which proved the formation of a CdHgTe polycrystalline layer with = 0.2 on the surface.…”
Section: Discussionsupporting
confidence: 90%
“…The difference between the effects that arise in the near-surface layer of a CdHgTe epitaxial film after its treatment with boron or silver ions stems from the opposite character of deformations generated by the ions in the crystal lattice of the semiconductor. In particular, the stretching deformations in the near-surface region of the -CdHgTe epitaxial film and the compression of deeper layers stimulate the "withdrawal" of silver ions to the surface and the formation of the Ag 2 O compound in the nearsurface layer of the matrix (in accordance to data of the X-ray diffraction analysis reported in work [18]). The propensity of silver to create solid solutions in -CdHgTe at the ionic implantation becomes a crucial factor.…”
Section: Discussionsupporting
confidence: 84%
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“…Note that the intrinsic defects, as well as ions, being introduced in MCT, demonstrate high diffusion ability. Taking into account that mercury is driven by the vacancy mechanism, whereas silver, for which ln D 0 = f (E act ), E act = 0.6 eV is the activation energy [15], moves by the dissociative mechanism, the migration of Hg i was found to be the dominating process in MCT [16]. The extension regions formed upon silver implantation into MCT shift the reaction to the left, and the compression of deeper layers of the loosened epitaxial film prevent the mercury diffusion into the target depth.…”
Section: Figurementioning
confidence: 99%