2009
DOI: 10.1016/j.jallcom.2009.06.139
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Structure and optical properties of nanocrystalline NiO thin film synthesized by sol–gel spin-coating method

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Cited by 227 publications
(64 citation statements)
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“…It represents entire information of optical transition and excitation of the phonons in a material. Dielectric constant can be calculated using the relation [34] e ¼ e r þ e i ¼ ðn þ ikÞ 2…”
Section: Optical Analysismentioning
confidence: 99%
“…It represents entire information of optical transition and excitation of the phonons in a material. Dielectric constant can be calculated using the relation [34] e ¼ e r þ e i ¼ ðn þ ikÞ 2…”
Section: Optical Analysismentioning
confidence: 99%
“…[5][6][7][8] Other noteworthy applications include Mott-Hubbard insulators and buffer layers for the deposition of other oriented films, such as superconducting films with well-matched lattice parameters, since NiO crystallizes in the cubic rock-salt structure with a lattice parameter of 4.17 Å . [9,10] NiO thin films have been grown by various deposition techniques, such as pulsed-laser deposition, [11] electronbeam and thermal evaporation, [12,13] reactive sputtering, [14] sol-gel deposition, [15] spray pyrolysis, [1,16] high-temperature oxidation, [17] chemical bath deposition, [3,18] and CVD. [19][20][21] In recent years, ALD has gained acceptance as a key technology for advanced thin film deposition in microelectronic applications.…”
Section: Introductionmentioning
confidence: 99%
“…1. As seen in XRD patterns, the diffraction peak displays only NiO cubic phase positioned at 2θ = 43.3° attributing to (200) orientation plane [15,16]. From XRD patterns, it is indicated that the growth along the (200) plane tends to be the preferred orientation of these films prepared by sol-gel route.…”
Section: Resultsmentioning
confidence: 87%