“…It should be pointed out that the obtained current as a function of dc electric field includes leakage current and phase transition current. More detailed explanations on this were reported in our previous work [21]. The difference in J-E curves between the two PZO films indicates that sample PZO-1 has a smaller leakage current in contrast to sample PZO-2.…”
“…It should be pointed out that the obtained current as a function of dc electric field includes leakage current and phase transition current. More detailed explanations on this were reported in our previous work [21]. The difference in J-E curves between the two PZO films indicates that sample PZO-1 has a smaller leakage current in contrast to sample PZO-2.…”
“…For the PZO film, current density had an obvious current peak around 300 kV/cm, which nearly correlated to the phase switching field. As the leakage current usually increases monotonically with the voltage, the current peak corresponding to negative resistance can be attributed to the domination of a displacive current, which itself is produced by the phase transition from antiferroelectric to ferroelectric; these findings are consistent with those in previous reports [ 28 , 29 ]. For ferroelectric materials, Krupanidhi et al pointed out that the ferroelectric polarization current can be ignored in relation to a time gap that is much larger than the domain switching speed [ 30 ].…”
PbZr0.35Ti0.65O3 (PZT), PbZrO3 (PZO), and PZT/PZO ferroelectric/antiferroelectric multilayer films were prepared on a Pt/Ti/SiO2/Si substrate using the sol–gel method. Microstructures and physical properties such as the polarization behaviors, leakage current, dielectric features, and energy-storage characteristics of the three films were systematically explored. All electric field-dependent phase transitions, from sharp to diffused, can be tuned by layer structure, indicated by the polarization, shift current, and dielectric properties. The leakage current behaviors suggested that the layer structure could modulate the current mechanism, including space-charge-limited bulk conduction for single layer films and Schottky emission for multilayer thin films. The electric breakdown strength of a PZT/PZO multilayer structure can be further enhanced to 1760 kV/cm, which is higher than PZT (1162 kV/cm) and PZO (1373 kV/cm) films. A recoverable energy-storage density of 21.1 J/cm3 was received in PZT/PZO multilayers due to its high electric breakdown strength. Our results demonstrate that a multilayer structure is an effective method for enhancing energy-storage capacitors.
“…With 0≤x≤0. In addition to phase compositions and dielectric properties, the critical switching fields between AFE and FE of PZ AFEs were also influenced by Ba 2+ or Sr 2+ -doping [170]. For example, pure PZ, 5 95/5 ceramics during the FE-AFE phase transition induced by the application of 2.9 GPa [178].…”
Section: Phase Switching Characteristics Of (Pba)zro 3 (A=ba Sr)mentioning
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