“…As we know, thermal energy can aid the transport of the charge carrier and strongly influence the leakage current, and the leakage current determines the breakdown field strength and thus the energy storage performance [ 8 , 9 ]. It is exciting that, with the application of interface engineering in multilayer films, the breakdown field strength can be effectively improved, and the wide-temperature storage characteristics can be improved by constructing multilayer structures reasonably [ 10 , 11 , 12 , 13 , 14 , 15 , 16 ]. However, the mechanism by which the structure influences the leakage current at high temperature is unclear.…”