2000
DOI: 10.1016/s0368-2048(00)00180-8
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Structural determination of sintered Si3N4/SiC nanocomposite using the XPS differential charge effect

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Cited by 48 publications
(19 citation statements)
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“…A peak at 101.3 eV (Si 2p) may reflect the existence of a SiOO bond. 7 The SiOO signal suggests that slight oxidation occurred at the surface of the SiC layer because XPS has the capability to detect chemical bonds within 10 nm from the surface.…”
Section: (1) Characterization Of Sic Coatingmentioning
confidence: 99%
“…A peak at 101.3 eV (Si 2p) may reflect the existence of a SiOO bond. 7 The SiOO signal suggests that slight oxidation occurred at the surface of the SiC layer because XPS has the capability to detect chemical bonds within 10 nm from the surface.…”
Section: (1) Characterization Of Sic Coatingmentioning
confidence: 99%
“…2(a) indicates that the Si-N bond was formed after NH 3 plasma treatment. 17) As shown in Fig. 2(b), the binding energies of the Si 2p electrons for samples with or without O 2 plasma treatment were all near 103.2 eV.…”
Section: Treatment With Single Plasmamentioning
confidence: 79%
“…shows high‐resolution XPS of C 1s region. The C 1s region can be deconvoluted into three Gaussian curves . The peaks located at 286.2 ± 0.3, 284.6 ± 0.2, and 283 eV were assigned to C−O, C−C/C−H, and C−Si, respectively .…”
Section: Resultsmentioning
confidence: 99%