1993
DOI: 10.1016/0040-6090(93)90456-y
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Structural characterization of preferentially oriented cubic BN films grown on Si (001) substrates

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Cited by 40 publications
(14 citation statements)
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“…We note that some early HRTEM observations suggesting strongly oriented cBN at the substrate interface [79,104] resulted from the misidentification of the tBN (0002) lattice fringes as cBN lattice fringes [80]. In addition, heteroepitaxial cBN growth on both Si(OO1) and diamond has been reported.…”
Section: Cbn Lqwmentioning
confidence: 99%
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“…We note that some early HRTEM observations suggesting strongly oriented cBN at the substrate interface [79,104] resulted from the misidentification of the tBN (0002) lattice fringes as cBN lattice fringes [80]. In addition, heteroepitaxial cBN growth on both Si(OO1) and diamond has been reported.…”
Section: Cbn Lqwmentioning
confidence: 99%
“…Ballal et al [79] presented electron diffraction evidence from a cross-sectioned cBN film showing strong peaks in the cBN { 111) and { 220) rings indicating a strong preferential orientation that they interpreted as a [ 1 lo] out-of-plane texture. Medlin et al [206] have presented similar data, but show that the data can be also interpreted as a [ 11 l] in-plnrze (or 'double-fiber ') texture.…”
Section: Cbn Lqwmentioning
confidence: 99%
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