Structural and Surface Morphology Analysis of Copper Phthalocyanine Thin Film Prepared by Pulsed Laser Deposition and Thermal Evaporation Techniques

Hussein, Mohammed T.; Aadim, Kadhim A.; Hassan, Eman K.

doi:10.4236/ampc.2016.64009

Cited by 20 publications

(7 citation statements)

References 11 publications

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“…The X-Ray diffraction patterns of the MnPc films are shown in Figure 4 . The diffractograms exhibit the characteristic diffraction peaks for the monoclinic phase of the MnPc films; this characteristic phase is confirmed by both the crystallographic cards and the reports found in the literature [ 18 , 35 , 36 , 37 , 38 , 39 , 40 , 41 ]. The monoclinic phase is found in the vast majority of metallic phthalocyanines where it is considered a dominant phase [ 42 , 43 ].…”

Section: Resultssupporting

confidence: 82%

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

et al. 2023

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In this work, we report how manganese phthalocyanine (MnPc) films obtained using the ultrasonic spray–pyrolysis technique at 40 °C deposited on glass substrate subjected to thermal annealing at 100 °C and 120 °C. The MnPc films were characterized using UV/Vis spectroscopy, Raman spectroscopy, X-Ray Diffraction (XRD), and Scanning Electron Microscopy (SEM). The absorption spectra of the MnPc films were studied in a wavelength range from 200 to 850 nm, where the characteristic bands of a metallic phthalocyanine known as B and Q bands were observed in this range of the spectrum. The optical energy band (Eg) was calculated using the Tauc equation. It was found that, for these MnPc films, the Eg has the values of 4.41, 4.46, and 3.58 eV corresponded to when they were deposited, annealing at 100 °C and 120 °C, respectively. The Raman spectra of the films showed the characteristic vibrational modes of the MnPc films. In the X-Ray diffractograms of these films, the characteristic diffraction peaks of a metallic phthalocyanine are observed, presenting a monoclinic phase. The SEM images of these films were studied in a cross-section obtaining thicknesses of 2 μm for the deposited film and 1.2 μm and 0.3 μm for the annealed films at 100 °C and 120 °C. Additionally, in the SEM images of these films, average particle sizes ranging from 4 to 0.041 µm were obtained. The results agree with those reported in the literature for MnPc films deposited by performing other techniques.

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Section: Resultssupporting

confidence: 82%

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

et al. 2023

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“…The X-ray diffraction patterns of the MnPc films are shown in Figure 3. The diffractograms show the characteristic diffraction peaks for the monoclinic phase films, this characteristic phase found is confirmed by both crystallographic cards and the reports found in the literature [24][25][26][27][28][29][30][31] . The monoclinic phase is found in the vast majority of metallic phthalocyanines where it is considered a dominant phase 32,33 .…”

Section: Resultssupporting

confidence: 82%

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

Zempoalteca¹,

Luz²,

Luna-Flores³

et al. 2023

Preprint

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In this work, we report manganese phthalocyanine (MnPc) films obtained by ultrasonic spray-pyrolysis technique at 40°C deposited on glass substrate subjected to thermal annealing at 100 °C and 120°C. The MnPc films were characterized by UV/Vis spectroscopy, Raman spectroscopy, X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The absorption spectra of the MnPc films were studied in a wavelength range from 200 to 850 nm, where the characteristic bands of a metallic phthalocyanine known as B and Q bands were observed in this range of the spectrum. The optical energy band (Eg) was calculated by the Tauc equation. It was found that for these MnPc films, the Eg has the values of 4.41, 4.46 and 3.58 eV corresponding to as deposited, annealing 100°C and 120°C, respectively. The Raman spectra of the films showed their characteristic vibrational modes of the MnPc films. In X-ray diffractograms of these films, the characteristic diffraction peaks of a metallic phthalocyanine are observed, presenting a monoclinic phase. SEM images of these films were studied in cross section obtaining thicknesses of 2, 1.2 and 0.3 μm to as deposited, annealing 100°C and 120°C, successively. Also, in the SEM images of these films, both the average particle sizes ranging from 4 to 0.041 µm and the average diameter from 4.8 to 0.091 μm were obtained. The results agree with those reported in the literature for MnPc films deposited with other techniques.

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“…As the annealing temperatures rise, the full width at half maximum (FWHM) in the primary orientation decreases significantly. This shows that the lattice quality has improved, as explained in [18]. This improvement allowed for the estimation of crystallite size using the Scherer equation.…”

Section: X-ray Diffractionmentioning

confidence: 53%

Study of the Effect of Thin Layer Thickness on the Structural Properties of Copper Phthalocyanine (CuPc) Films Prepared by Vacuum Thermal Evaporation Method

Alhiti,

Jawad,

Abd Alwaahed

et al. 2024

Al-Kitab J. Pure Sci.

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The structural properties of thin films prepared with different thicknesses before and after the annealing process and at different temperatures were studied. X-ray diffraction (XRD), atomic force microscopy (AFM), and emission scanning electron microscopy (FESEM) were used to study the structural properties. X-ray diffraction analysis revealed that the thin films prepared with different thicknesses, as well as those annealed at temperatures of 300 and 373 K, were composed of the β-phase, which is widely known as the most stable phase. The analysis also showed that the material has a polycrystalline structure characterized by a monoclinic crystal system. The density shows a constant increase in all thin films, with the dominant trend being (312) for all films. Atomic force microscopy (AFM) measurement results indicated that there was an increase in roughness with a change in the thickness of the thin films. In addition, there was an increase in the crystalline size of the thin films that underwent annealing at 300 and 373 K. However, there was a decrease in crystallite size at the annealing temperature of 473 K due to the phase change of the thin film material.

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Structural and Surface Morphology Analysis of Copper Phthalocyanine Thin Film Prepared by Pulsed Laser Deposition and Thermal Evaporation Techniques

Cited by 20 publications

References 11 publications

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

MnPc Films Deposited by Ultrasonic Spray Pyrolysis at Low Temperatures: Optical, Morphological and Structural Properties

Study of the Effect of Thin Layer Thickness on the Structural Properties of Copper Phthalocyanine (CuPc) Films Prepared by Vacuum Thermal Evaporation Method

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